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Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene

Published

Author(s)

Thomas A. Germer

Abstract

We measured the Mueller matrix bidirectional reflectance distribution function (BRDF) of a sintered polytetrafluoroethylene (PTFE) sample over the scattering hemisphere for six incident angles (0◦ to 75◦ in 15◦ steps) and for four wavelengths (351 nm, 532 nm, 633 nm, and 1064 nm). The data for each wavelength were fit to a phenomenological description for the Mueller matrix BRDF that is an extension of the bidirectional surface scattering modes developed by Koenderink and van Doorn [J. Opt. Soc. Am. A 15, 2903-2912 (1998)] for unpolarized BRDF. This description is designed to be complete, to obey the appropriate reciprocity conditions, and to provide a full description of the Mueller matrix BRDF as a function of incident and scattering directions for each wavelength. The description was further extended by linearizing the surface scattering mode coefficients with wavelength. This dataset and its parameterization provides a comprehensive on-demand description of the reflectance properties for this commonly used diffuse reflectance reference material over a wide range of wavelengths.
Citation
Applied Optics
Volume
56
Issue
33

Keywords

BRDF, Mueller matrix, PTFE, reflectance

Citation

Germer, T. (2017), Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene, Applied Optics, [online], https://doi.org/10.1364/AO.56.009333 (Accessed May 27, 2024)

Issues

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Created November 20, 2017, Updated January 27, 2020