Germer, T.
, Foldyna, M.
and Mrazkova, Z.
(2016),
Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces, Reflection, Scattering, and Diffraction from Surfaces V, San Diego, CA, US, [online], https://doi.org/10.1117/12.2236976, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921524
(Accessed April 19, 2024)
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Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces
Published
Author(s)
, Martin Foldyna, Zuzana Mrazkova
Abstract
Surface texturing plays an important role in trapping light in photovoltaic materials. Understanding and modeling diffuse scatter from various textured silicon surfaces should aid in increasing light trapping in these materials, as well as improving material characterization and inspection during manufacture. We have performed Mueller matrix bidirectional reflectance distribution function (BRDF) measurements from a variety of textured silicon surfaces. Simulations, using multiple reflection polarization ray tracing, reproduce many of the features in the data. Evidence for diffraction, however, can also be observed, suggesting that a purely ray-tracing approach is insufficient for accurately describing the scatter from these materials.Proceedings Title
Reflection, Scattering, and Diffraction from Surfaces V
Volume
9961
Conference Dates
August 28-29, 2016
Conference Location
San Diego, CA, US
Conference Title
SPIE Optics and Photonics
Pub Type
Conferences
Download Paper
Keywords
BRDF, Mueller matrix, photovoltaics, pyramids, scattering, surface texture
Citation
Created October 25, 2016, Updated April 7, 2022