Goniometric and hemispherical reflectance and transmittance measurements of fused silica diffusers

Published

October 11, 2016

Author(s)

Paul Lemaillet, Heather Patrick, Thomas Germer, Leonard Hanssen, B. Carol Johnson, Georgi T. Georgiev

Abstract

Fused silica diffusers, made by forming scattering centers inside fused silica glass, can exhibit desirable optical properties, such as reflectance or transmittance independent of viewing angle, spectrally flat response into the ultraviolet wavelength range, and good spatial uniformity. The diffusers are of interest for terrestrial and spaceborne remote sensing instruments, which use light diffusers in reflective and transmissive applications. In this work, we report exploratory measurements of two samples of fused silica diffusers using four facilities. We will present goniometric bidirectional scattering distribution function (BSDF) measurements under normal illumination provided by the National Institute of Standards and Technology (NIST)'s Goniometric Optical Scatter Instrument (GOSI), by NIST's Infrared reference integrating sphere (IRIS) and by the National Aeronautics and Space Administration (NASA)'s Diffuser Calibration Facility. We also present hemispherical diffuse transmittance and reflectance measurements provided by NIST's Diffuse Optical Scattering Instrument (DOSI). The data from the DOSI is analyzed by Prahl's inverse adding-doubling algorithm to obtain the absorption and reduced scattering coefficient of the samples. Implications of fused silica diffusers for remote sensing applications are discussed.

Citation

Proceedings of SPIE

Volume

9961

Pub Type

Journals

Download Paper

https://doi.org/10.1117/12.2237975

Local Download

Keywords

reflectance, transmittance, BRDF, BTDF, scattering coefficients, diffusers, fused silica

Citation

Lemaillet, P. , Patrick, H. , Germer, T. , Hanssen, L. , Johnson, B. and Georgiev, G. (2016), Goniometric and hemispherical reflectance and transmittance measurements of fused silica diffusers, Proceedings of SPIE, [online], https://doi.org/10.1117/12.2237975, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921734 (Accessed April 19, 2024)