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Displaying 55026 - 55050 of 74165

Electrical Test Structures Replicated in Silicon-on-Insulator Material

December 31, 1996

Author(s)

Michael W. Cresswell, J. J. Sniegowski, Rathindra Ghoshtagore, Richard A. Allen, Loren W. Linholm, John S. Villarrubia

From Testing-In to Building-In Reliability

December 31, 1996

Author(s)

Harry A. Schafft, D. L. Erhart, W. K. Gladden

High-Accuracy Critical-Dimension Metrology Using a Scanning Electron Microscope

December 31, 1996

Author(s)

J R. Lowney, Andras Vladar, Michael T. Postek

Hot-electron Microcalorimeter for X-ray Detection Using a Superconducting Transition Edge Sensor with Electrothermal Feedback

December 31, 1996

Author(s)

Kent D. Irwin, Gene C. Hilton, John M. Martinis, B. Cabrera

Hot-Electron-Microcalorimeters with 0.25 mm 2 Area

December 31, 1996

Author(s)

John M. Martinis

Hot-Electron-Microcalorimeters with 0.25 mm2 Area

December 31, 1996

Author(s)

John M. Martinis

Hybrid Optical-Electrical Overlay Test Structure

December 31, 1996

Author(s)

Michael W. Cresswell, Richard A. Allen, Loren W. Linholm, William F. Guthrie, A. W. Gurnell

IGBT Half-Bridge Shoot-Through Characterization for Model Validation

December 31, 1996

Author(s)

David W. Berning, Allen R. Hefner Jr.

A circuit is described for making a variety of measurements on half-bridge Insulated Gate Bipolar Transistor (IGBT) pairs for validating IGBT models. The circuit incorporates two robust isolated gate drives for the IGBTs. Each IGBT is driven with an eight

Measurements of Fracture Strength and Young's Modulus of Surface-Micromachined Polysilicon

December 31, 1996

Author(s)

David T. Read, Janet M. Cassard

Microheating Elements in CMOS Technology

December 31, 1996

Author(s)

Michael Gaitan

Micromachined Microwave Transmission Lines by Commercial CMOS Fabrication

December 31, 1996

Author(s)

V. Milanovic, Michael Gaitan, E. D. Bowen, Mona E. Zaghloul

Micromachined Thermocouple Microwave Detector in CMOS Technology

December 31, 1996

Author(s)

V. Milanovic, Michael Gaitan, Mona E. Zaghloul

MOCVD of SnO 2 on Silicon Microhotplate Arrays for Use in Gas Sensing Applications

December 31, 1996

Author(s)

F. DiMeo, Stephen Semancik, Richard E. Cavicchi, John S. Suehle, P Chaparala, N. H. Tea

Monte Carlo Simulation of Scanning Electron Microscope Signals for Lithographic Metrology

December 31, 1996

Author(s)

J R. Lowney

Natural Convection from an Array of Electronic Packages Mounted on a Horizontal Board in a Narrow Aspect Ratio Enclosure

December 31, 1996

Author(s)

V. H. Adams, Yogendra K. Joshi, David L. Blackburn

On Calculating the Reflectance and Transmittance of Light for a Simple Thick Grating Structure

December 31, 1996

Author(s)

Jay F. Marchiando

On the Road to Building-In Reliability

December 31, 1996

Author(s)

D. L. Erhart, Harry A. Schafft, W. K. Gladden

On Using Collocation in Three Dimensions and Solving a Model Semiconductor Problem, Application of the Collocation Method in Three Dimensions to a Model Semiconductor Problem

December 31, 1996

Author(s)

Jay F. Marchiando

Real-Time Thermal Infrared Scene Generation Technology and Its Application in the Test and Calibration of Infrared Sensors and Seekers

December 31, 1996

Author(s)

R. B. Johnson, R. Chung, Michael Gaitan

Recent Developments in Electrical Linewidth and Overlay Metrology for Integrated Circuit Fabrication Processes

December 31, 1996

Author(s)

Michael W. Cresswell, J. J. Sniegowski, Rathindra Ghoshtagore, Richard A. Allen, William F. Guthrie, A. W. Gurnell, Loren W. Linholm, E C. Teague