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Displaying 55051 - 55075 of 74165

Z-propagating waveguide lasers in rare-earth-doped Ti:LiNbO 3

December 16, 1996
Author(s)
J. Amin, J. A. Aust, Norman Sanford
A means of reproducibly fabricating stable cw lasers in rare-earth-doped Ti:LiNb0 3 has been demonstrated through judicious choice of waveguide orientation. Z-propagating waveguides have been fabricated in Nd- and Er-diffused Ti:LiNb0 3 and room

Is Your Scanning Electron Microscope Hi-Fi?

December 7, 1996
Author(s)
Andras Vladar, Michael T. Postek, S Davilla
The scanning electron microscope (SEM) historically has been used mainly as an image-producing device and, in spite of certain obvious and sometimes serious electronics problems, serves in this function as an acceptable and effective instrument for many

Calibration Comparison Method for Vector Network Analyzers

December 1, 1996
Author(s)
Roger Marks, Jeffrey A. Jargon, John R. Juroshek
We present a technique for comparing the scattering parameter measurements made with respect to two vector network analyzer calibrations. This method determines the worst-case measurement error bounds on any calibration from a benchmark calibration

Calibration in Multiconductor Transmission Lines

December 1, 1996
Author(s)
Dylan F. Williams
Abstract: This paper presents a calibration and measurement method for circuits embedded in lossy printed multiconductor transmission lines. The experimental results illustrate the complexity of the modal representation and the utility of the conductor
Displaying 55051 - 55075 of 74165
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