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Metrology for Information Technology (IT)

Published

Author(s)

Lisa Carnahan, M M. Gray, Michael Hogan, Ted Hopp, Jeffrey Horlick, Gordon E. Lyon, Elena R. Messina

Abstract

The scope of this white paper is the testing or measuring of digital information technology (IT) systems attributes or proporties; the use of digitial IT systems in testing and measuring; and the underlying mathematical, computational, and statistical sciences used in testing and measuring. This paper suggests a conceptual basis for IT metrology; reviews IT testing methods, the status of IT metrology, and opportunities for advancing IT metrology; and notes possible roles for NIST. One goal of this white paper is to apply the concepts of metrology to IT systems. Another goal is to relate measurements in IT to established concepts of traceability.

Citation
NIST Interagency/Internal Report (NISTIR) - 6025
Report Number
6025
Volume
5
Issue
No. 3

Keywords

conformance testing, digital information technology, digital systems, information technology, interoperability testing, IT metrology, metrology

Citation

Carnahan, L. , Gray, M. , Hogan, M. , Hopp, T. , Horlick, J. , Lyon, G. and Messina, E. (1997), Metrology for Information Technology (IT), NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed June 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 1996, Updated October 12, 2021