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From Testing-In to Building-In Reliability

Published

Author(s)

Harry A. Schafft, D. L. Erhart, W. K. Gladden
Proceedings Title
Proc., RELECTRONIC '95 Ninth Symposium on Quality and Reliability in Electronics
Conference Dates
October 16-18, 1995
Conference Location
Budapest, 1, HU

Citation

Schafft, H. , Erhart, D. and Gladden, W. (1996), From Testing-In to Building-In Reliability, Proc., RELECTRONIC '95 Ninth Symposium on Quality and Reliability in Electronics, Budapest, 1, HU (Accessed April 22, 2024)
Created December 30, 1996, Updated October 12, 2021