U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 9451 - 9475 of 13224

Infrared Spectra of the Noble Gases

August 1, 2002
Author(s)
Craig J. Sansonetti, M M. Blackwell, Edward B. Saloman
… Data Center of the National Institute of Standards and Technology (NIST) is currently compiling spectra and energy … of the infrared spectrum for any of the neutral gases. In response, we have made high-resolutio observations of the spectra of Ne, Kr, and Xe in the region 0.7 to 5.0 m with the 2-m NIST Fourier …

Techniques to Improve Bluetooth Performance in Interference Environments

October 1, 2001
Author(s)
Nada T. Golmie, Nicolas Chevrollier
… Bluetooth is a radio technology for Wireless Personal Area Networks operating in the 2.4 GHz ISM band. Since both Bluetooth and IEEE 802.11 … use the same frequency band and may likely come together in a laptop or may be close together at a desktop, … Techniques to Improve Bluetooth Performance in Interference Environments …

Appendix: Auditory Diagnostic and Prosthetic Devices

September 3, 2001
Author(s)
Victor Nedzelnitsky
… series of workshops and topical meetings organized by NIST in the area of biomedical technology. The workshop complements other recent NIST efforts to make its leadership in standards and measurements more available to the health …

Basic Procedures in Force Calibration at NIST

July 29, 2001
Author(s)
Ricky L. Seifarth, Samuel L. Ho
… obtainable at the National Institute of Standards and Technology (NIST) continue to focus on extracting the maximum … Basic Procedures in Force Calibration at NIST …

Electrometrology and NIST -- New Directions

July 1, 2001
Author(s)
William E. Anderson
… ball to predict the directions of electrical metrology in the next fifteen years. The emphasis on standards based on … to the marketplace. The need for NIST to lead the world in implementing fundamental electrical measurements will not …

SI Traceability of Force at the Nanonewton Level

July 1, 2001
Author(s)
David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, L. A. Feeney, Edwin R. Williams
… Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a … below one newton. The National Institute of Standards and Technology has launched a five-year inter-laboratory project …

Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices

May 7, 2001
Author(s)
Angela Hodge, R. Newcomb, Allen R. Hefner Jr.
… An oscillation-based built in self-test (BIST) method is presented for functional … needed for developing the design reuse approach for multi-technology Systems-on-a-Chip (SoC) devices. … Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices …

Cryptographic Protection for the Twenty-First Century

March 1, 2001
Author(s)
Elaine B. Barker
… In 2000, the National Institute of Standards and Technology … the Data Encryption Standard (DES) that was adopted in 1977 and is now considered to be inadequate to protect …

Energy Dispersive X-ray Analysis using a Microcalorimeter Detector

January 29, 2001
Author(s)
W. Harris, L. Le Tarte, H. Bakhru, W. Gibson, D. Wu, Robert E. Geer, David A. Wollman
… chemical analysis and identification of features observed in scanning electron microscopy images. While this technique … characterization, current commercially available detector technology suffers from poor energy resolving power and is …

SI Traceability of Force at the Nanonewton Level

January 1, 2001
Author(s)
David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, L Feeney, Edwin R. Williams
… Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a … below one newton. The National Institute of Standards and Technology has launched a five-year inter-laboratory project …

Emission-Line Intensity Ratios in FeXVII Observed with a Microcalorimeter on an Electron Beam Ion Trap

December 1, 2000
Author(s)
J M. Laming, I Kink, E Takacs, James V. Porto, John D. Gillaspy, E Silver, H. Schnopper, Simon R. Bandler, N Brickhouse, S Murray, M Barbera, A K. Bhatia, G. A. Doschek, N. Madden, D Landis, J. Beeman, E. E. Haller
… conditions, using the National Institute of Standards and Technology electron beam ion trap (EBIT) with a … observations, suggesting that other proceses not present in our experiment must play a role in forming the Fe XVII spectrum in solar and astrophysical … Emission-Line Intensity Ratios in FeXVII Observed with a Microcalorimeter on an Electron …

NIST artifact standards for fiber optic metrology

January 1, 2000
Author(s)
Paul A. Williams
… metrology at the National Institute of Standards and Technology is through artifact standards called Standard … dispersion and polarization-dependent loss in fibers. This paper will discuss the characteristics, …

NIST Measurement Services: Error Analysis and Calibration Uncertainty of Capacitance Standards at NIST

January 1, 2000
Author(s)
Yui-May Chang
… calibrations at the National Institute of Standards and Technology (NIST). Based on considerations of the measuring … check standards and customer's standards, uncertainties in the calibrations for each model and nominal value of … as expanded uncertainties using the coverage factor k = 2, in accordance with NIST Technical Note 1297. Also included …

Ultrasensitive Surface Spectroscopy With a Miniature Optical Resonator

October 1, 1999
Author(s)
A C. Pipino
… a miniature total-internal-reflection-ring cavity in a novel realization of the cavity ring-down optical … that are sensitive to the presence of absorbing species in the evanescent field near a civity facet. The TIR-ring cavity forms the basis for a new chemical sensing technology that extends civity ring-down spectroscopy to …

Recent Developments in Detector-Based Photometry and Future Needs in Photometry

September 30, 1999
Author(s)
Yoshihiro Ohno
… units at the National Institute of Standards and Technology (NIST). The detector-based calibration procedures … utilizing standard photometers have been implemented in various photometric calibrations including those for … method, and discusses future needs for standards in photometry. …

Long Term Stability of YBCO-Based Josephson Junctions

June 1, 1999
Author(s)
Leila R. Vale, Ronald H. Ono, J. Talvacchio, M. G. Forrester, B. D. Hunt, M. S. DiTorio, Ki Youl Yang, S. Yoshizumi
… We report on a study of long term aging in three different types of Yba 2 Cu 3 O 7-x Josephson … junctions. Junction aging will affect the choices made in integrating this technology with actual applications. The junction types used …

Conformance Testing and Certification Model for Software Specifications

March 1, 1999
Author(s)
Lisa J. Carnahan, Lynne S. Rosenthal, Mark Skall
… requirements and conformance will increase as information technology systems and applications grow more complex. Models … by identifying key roles, activities and products involved in any conformance testing and certification program. The authors have successfully used this model in helping private-sector organizations establish their …

Comparison of the NIST and BIPM Air-Kerma Standards for Measurements in the Low-Energy X-Ray Range

February 1, 1999
Author(s)
D T. Burns, P J. Lamperti, C M. O'Brien
… x rays at the National Institute of Standards and Technology (NIST) and at the Bureau International des Poids … out at the BIPM using the BIPM reference beam qualities in the range for 10 kilovolts (kV) to 100 kV. The results show the standards to be in agreement to around 0.5% at reference beam qualities up to …

Ultra-Thin Film Dielectric Reliability Characterization

January 15, 1999
Author(s)
John S. Suehle
… a critical concern as oxide thickness is scaled below 4 nm in future technology nodes. The breakdown detection algorithms in traditional reliability characterization techniques must …

Tip Characterization for Dimensional Nanometrology

January 1, 1999
Author(s)
John S. Villarrubia
… Scanning probe microscopy has unique advantages in this size regime, but width and roughness measurements … with the finite size of SPM tips and to make accessible in practical form recent advances in tip and sample reconstruction techniques. To that end, in … Chapter in: Industrial SXM Techniques …
Displaying 9451 - 9475 of 13224
Was this page helpful?