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Long Term Stability of YBCO-Based Josephson Junctions



Leila R. Vale, Ronald H. Ono, J. Talvacchio, M. G. Forrester, B. D. Hunt, M. S. DiTorio, Ki Youl Yang, S. Yoshizumi


We report on a study of long term aging in three different types of Yba2Cu3O7-x Josephson junctions. Junction aging will affect the choices made in integrating this technology with actual applications. The junction types used in this study are (a) Co-doped barrier edge SNS junctions, (b) noble-metal SNS step-edge junctions, and ) bicrystal junctions which are either unpassivated or passivated in situ with a normal metal shunt or an epitaxial insulator. While all the junctions show degradation, for some the long term survival rate is encouraging.
IEEE Trans. Appl. Superconductivity


Josephson junctions, thin film electronic devices, YBCO


Vale, L. , Ono, R. , Talvacchio, J. , Forrester, M. , Hunt, B. , DiTorio, M. , Yang, K. and Yoshizumi, S. (1999), Long Term Stability of YBCO-Based Josephson Junctions, IEEE Trans. Appl. Superconductivity (Accessed July 14, 2024)


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Created May 31, 1999, Updated October 12, 2021