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Long Term Stability of YBCO-Based Josephson Junctions

Published

Author(s)

Leila R. Vale, Ronald H. Ono, J. Talvacchio, M. G. Forrester, B. D. Hunt, M. S. DiTorio, Ki Youl Yang, S. Yoshizumi

Abstract

We report on a study of long term aging in three different types of Yba2Cu3O7-x Josephson junctions. Junction aging will affect the choices made in integrating this technology with actual applications. The junction types used in this study are (a) Co-doped barrier edge SNS junctions, (b) noble-metal SNS step-edge junctions, and ) bicrystal junctions which are either unpassivated or passivated in situ with a normal metal shunt or an epitaxial insulator. While all the junctions show degradation, for some the long term survival rate is encouraging.
Citation
IEEE Trans. Appl. Superconductivity
Volume
9
Issue
2

Keywords

Josephson junctions, thin film electronic devices, YBCO

Citation

Vale, L. , Ono, R. , Talvacchio, J. , Forrester, M. , Hunt, B. , DiTorio, M. , Yang, K. and Yoshizumi, S. (1999), Long Term Stability of YBCO-Based Josephson Junctions, IEEE Trans. Appl. Superconductivity (Accessed April 17, 2024)
Created May 31, 1999, Updated October 12, 2021