Vale, L.
, Ono, R.
, Talvacchio, J.
, Forrester, M.
, Hunt, B.
, DiTorio, M.
, Yang, K.
and Yoshizumi, S.
(1999),
Long Term Stability of YBCO-Based Josephson Junctions, IEEE Trans. Appl. Superconductivity
(Accessed April 23, 2024)
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Long Term Stability of YBCO-Based Josephson Junctions
Published
Author(s)
, , J. Talvacchio, M. G. Forrester, B. D. Hunt, M. S. DiTorio, Ki Youl Yang, S. Yoshizumi
Abstract
We report on a study of long term aging in three different types of Yba2Cu3O7-x Josephson junctions. Junction aging will affect the choices made in integrating this technology with actual applications. The junction types used in this study are (a) Co-doped barrier edge SNS junctions, (b) noble-metal SNS step-edge junctions, and ) bicrystal junctions which are either unpassivated or passivated in situ with a normal metal shunt or an epitaxial insulator. While all the junctions show degradation, for some the long term survival rate is encouraging.Citation
IEEE Trans. Appl. Superconductivity
Volume
9
Issue
2
Pub Type
Journals
Keywords
Josephson junctions, thin film electronic devices, YBCO
Citation
Created May 31, 1999, Updated October 12, 2021