NIST Measurement Services: Error Analysis and Calibration Uncertainty of Capacitance Standards at NIST

Published

January 1, 2000

Author(s)

Yui-May Chang

Abstract

This document presents the analysis of error sources that contribute to the total uncertainty of capacitance calibrations at the National Institute of Standards and Technology (NIST). Based on considerations of the measuring systems and calibration procedures, and data taken on NIST working and check standards and customer's standards, uncertainties in the calibrations for each model and nominal value of capacitor are estimated. The results of the analysis are expressed as expanded uncertainties using the coverage factor k = 2, in accordance with NIST Technical Note 1297. Also included are a detailed description and analysis for each component of error in the evaluation of Type A and Type B standard uncertainties.

Citation

Special Publication (NIST SP) - 250-52

Report Number

250-52

NIST Pub Series

Special Publication (NIST SP)

Pub Type

NIST Pubs

Download Paper

https://doi.org/10.6028/NIST.SP.250-52

Keywords

calibration, capacitance bridges, capacitance measurements, capacitance standards, conductance measurements, conductance standards, dial corrections, error analysis, expanded uncertainties

Citation

Chang, Y. (2000), NIST Measurement Services: Error Analysis and Calibration Uncertainty of Capacitance Standards at NIST, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.250-52 (Accessed October 15, 2025)