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Displaying 1426 - 1450 of 4634

Coherence of Quantum Superpositions Through Coupling to Engineered Reservoirs

January 1, 2002
Author(s)
C J. Myatt, B E. King, Q A. Turchette, C A. Sackett, D Kielpinski, Wayne M. Itano, C Monroe, David J. Wineland
The theory of quantum mechanics applies to closed systems. In such ideal situations, a single atom can, for example, exist simultaneously in a superposition of two different spatial locations. In contrast, real systems always interact with their

Highly Reversible Zinc Metal Anode for Aqueous Batteries

June 1, 2018
Author(s)
Fei Wang, Oleg Borodin, Tao Gao, Xiulin Fan, Wei Sun, Fudong Han, Antonio Faraone, Joseph Dura, Kang Xu, Chunsheng Wang
… chemistry research due to increased safety concern on Li-ion batteries. However, Zn chemistry persistently suffers …

Experimental Study of Caesium 6PJ+ 6PJ --> 7PJ? + 6S energy pooling collisions and modeling of the excited atom density in the presence of optical pumping and radiation trapping

July 5, 1997
Author(s)
F D. Tomasi, J Huennekens, Zeina J. Kubarych, A Allegrini, A Fioretti, P Verker, S Milosevic
… of the capillary cell minimizes the effects of radiation trapping, but nonetheless, such effects still play a … effects of saturation, optical pumping, and radiation trapping, has been developed and is used to determine the … density in the presence of optical pumping and radiation trapping …

SRM 1450d, Fibrous-Glass Board, for Thermal Conductivity from 280 K to 340 K

August 1, 2011
Author(s)
Robert R. Zarr, Amanda C. Harris, John F. Roller, Stefan D. Leigh
Thermal conductivity measurements at and near room temperature are presented as the basis for certified values of thermal conductivity for SRM 1450d, Fibrous Glass Board. The measurements have been conducted in accordance with a randomized full factorial

Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics

February 1, 2007
Author(s)
Christine M. Mahoney, Albert J. Fahey, John G. Gillen
… Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl … rates, damage cross sections, and overall secondary ion stability) were monitored as a function of temperature. … in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth …
Displaying 1426 - 1450 of 4634
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