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The Use of a Spherically Curved Crystal Spectrometer for X-ray Measurements on Electron Beam Ion Trap

Published

Author(s)

Y Aglitskiy, F. G. Serpa, E S. Meyer, John D. Gillaspy, C M. Brown
Citation
Physica Scripta
Volume
58

Citation

Aglitskiy, Y. , Serpa, F. , Meyer, E. , Gillaspy, J. and Brown, C. (1998), The Use of a Spherically Curved Crystal Spectrometer for X-ray Measurements on Electron Beam Ion Trap, Physica Scripta (Accessed December 8, 2024)

Issues

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Created December 31, 1997, Updated October 12, 2021