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Displaying 1726 - 1750 of 2289

Multiferroic Behaviour in the New Double-Perovskite Lu 2 MnCoO 6

October 18, 2011
Author(s)
S. Yanez-Vilar, E. D. Mun, V. S. Zapf, B. G. Ueland, Jason S. Gardner, J. D. Thompson, J. Singleton, M. Sanchez-Andujar, J. Mira, N. Biskup, Rodriguez Senaris, C. D. Batista
We present a new member of the multiferroic oxides, Lu 2MnCoO 6, which we have investigated using X-ray diffraction, neutron diffraction, specific heat, magnetization, electric polarization, and dielectric constant measurements. This material possesses an

Structure of lithium peroxide

September 12, 2011
Author(s)
Eric L. Shirley, Maria K. Chan, Naba Karan, Mahalingam Balasubramanian, Yang Ren, Jeffrey P. Greeley, Timothy T. Fister
The reliable identification of lithium oxides species, especially lithium peroxide (Li2O2), is of vital importance to the study of Li-air batteries. Previous x-ray diffraction studies of Li2O2 resulted in the proposal of two disparate structures by Féher

A Photoconductivity Technique for the Assessment of Pigment Reactivity

November 19, 2003
Author(s)
Joannie W. Chin, S J. Scierka, T Kim, Amanda L. Forster
Large volumes of titanium dioxide (TiO2) are utilized each year in coatings, sealants, plastics and paper for opacification and pigmentation purposes. It is well known that the photoreactivity of TiO2 can contribute to the degradation of the material that

Characterization of Chemical-Vapor-Deposited Low-K Thin Films Using X-Ray Porosimetry

February 1, 2003
Author(s)
V. J. Lee, Eric K. Lin, Barry J. Bauer, Wen-Li Wu, B K. Hwang, W D. Gray
Trimethylsilane based carbon doped silica films prepared with varying chemical vapor deposition process conditions were characterized using x-ray reflectivity and porosimetry to measure the film thickness, average film density, density depth profile, wall

Multifunctional ToF-SIMS: Combinatorial Mapping of Gradient Energy Substrates

November 1, 2002
Author(s)
S V. Roberson, Albert J. Fahey, A Sehgal, Alamgir Karim
We present a simple method for chemical modification of chlorosilane self-assembled monolayers (SAMS) on Si surfaces by exposure to a gradient of UV-ozone radiation to create stable substrates with a range of contact angles (θ H2O {approximately equal to}

Absolute Molecular Orientational Distribution of the Polystyrene Surface

April 1, 2001
Author(s)
Kimberly A. Briggman, John C. Stephenson, William E. Wallace, Lee J. Richter
Vibrationally-resonant sum frequency generation (VR-SFG) has been used to study the absolute molecular orientational distribution of the pendant phenyl groups at the free surface of polystyrene (PS) thin films on oxidized Si substrates. Characterization of

Low Voltage Microanalysis using Microcalorimeter EDS

January 1, 2001
Author(s)
David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, John M. Martinis, Martin Huber, Dale Newbury
… including analyses of small contaminant particles (Al, Al oxide, Cu) and thin films (TiN, TiO 2 , o.5 wt.% Cu in Al). …
Displaying 1726 - 1750 of 2289
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