Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Magnetic-Field Dependence of the Reversible Axial-Strain Effect in Y-Ba-Cu-O Coated Conductors

Published

Author(s)

Najib Cheggour, John (Jack) W. Ekin, C. L. H. Thieme

Abstract

The critical-current density Jc of an yttrium-barium- copper-oxide (YBCO) coated conductor deposited on a biaxially-textured Ni-5at.%W substrate was measured at 76.5 K as a function of axial tensile strain ε and magnetic field i}B applied parallel to the YBCO (a,b) plane. Reversibility of Jc with strain was observed up to ε approximately equal} 0.6 % over the entire field range studied (from 0.05 to 16.5 T), which confirms the existence of an intrinsic strain effect in YBCO coated conductors. Jc vs. ε epends strongly on magnetic field. The decrease of Jc(ε) grows systematically with magnetic field above 2-3 T, and, unexpectedly, the reverse happens below 2 T as this decrease shrinks with increasing field. The pinning force density Fp = Jc × i}B scaled with field for all values of strain applied, which shows that Fp can be written as K(T,ε)bp(1 – b)q, where i}p and i}q are constants, K is a function of temperature and strain, b = B/B*c2 is the reduced magnetic field, and B*c2 is the effective upper critical field at which Fp(B) extrapolates to zero.
Citation
IEEE Transactions on Applied Superconductivity
Volume
15
Issue
2

Keywords

Coated Conductors, critical current, pinning force, RABiTs, reversible strain effect, scaling, YBCO

Citation

Cheggour, N. , Ekin, J. and Thieme, C. (2005), Magnetic-Field Dependence of the Reversible Axial-Strain Effect in Y-Ba-Cu-O Coated Conductors, IEEE Transactions on Applied Superconductivity, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31877 (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 31, 2005, Updated October 12, 2021