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NIST Authors in Bold

Displaying 1651 - 1675 of 2915

Mechanical Properties of Polymer Nano-Films

November 28, 2011
Author(s)
Junghyun Lee, Jun Y. Chung, Christopher Stafford
Three fundamental mechanical properties of supported glassy polystyrene films with thickness ranging from 250 nm to 9 nm were quantitatively determined by a recently developed wrinkling-cracking method. Films below about 40 nm showed a decrease in both

NIST SP 500-268, Source Code Security Analysis Tool Function Specification Version 1.1

February 28, 2011
Author(s)
Elizabeth N. Fong, Paul E. Black, Michael J. Kass, Hsiao-Ming M. Koo
Software assurance tools are a fundamental resource to improve assurance in today's software applications. Some tools analyze software requirements or design models to help determine if an application is secure. Others analyze source code or executables

High-voltage Nanoimprint Lithography of Refractory Metal Film

July 1, 2010
Author(s)
John A. Dagata, Natalia Farkas, R Ramsier
Local oxidation of metal, semiconductor, and polymer surfaces has provided a common basis from which to explore fundamental principles of nanolithography and prototype functional nanostructures for many years now. This article summarizes an investigation

Metrology of Molecular Devices made by Flip Chip Lamination

April 30, 2010
Author(s)
Christina A. Hacker, Mariona Coll Bau, Curt A. Richter
Scaling of conventional electronics has continued unabated to dimensions approaching fundamental physical limits. As technology continues to evolve there are increasing demands to identify alternate routes of performing electrical functions. One potential

Roles of Adhesive and Interfacial Properties on Humidity-induced Failure

February 21, 2010
Author(s)
Kar T. Tan, Christopher C. White, Donald L. Hunston, Kristen L. Steffens, Hatlee Timothy, Kristen Hamilton, Vogt D. Bryan
Adhesion loss due to moisture is a fundamental problem in a large diversity of industries ranging from microelectronics and automotive to aerospace. This study investigates the durability of model adhesive joints consisting of a homologous series of poly(n

NBTI: Why Won't This Thing Go Away?

October 19, 2009
Author(s)
Jason P. Campbell
The negative-bias temperature instability (NBTI) is a reliability problem that, in the last ten years, has risen from relative obscurity to become the most important reliability problem in advanced pMOSFET devices. Even though a significant effort has been

Magnetic Tunnel Junctions with Self-Assembled Molecules

February 5, 2009
Author(s)
Wenyong Wang, Curt A. Richter
Molecular electronic devices with spin-dependent tunneling (SDT) transport behavior offer an innovative and extremely enticing direction towards spin electronics, both from fundamental and technological points of view. In this work, such molecular magnetic

Extraction of Sheet Resistance and Line Width from All-Copper ECD Test Structures Fabricated from Silicon Preforms

November 3, 2008
Author(s)
Byron J. Shulver, Andrew S. Bunting, Alan Gundlach, Les I. Haworth, Alan W. Ross, Stewart Smith, Anthony J. Snell, J. T. Stevenson, Anthony Walton, Richard A. Allen, Michael W. Cresswell
Test structures have been fabricated to allow Electrical Critical Dimensions (ECD) to be extracted from copper features with dimensions comparable to those replicated in IC interconnect systems. The implementation of these structures is such that no

Roughness-Induced Superhydrophobicity: A Way to Design Non-Adhesive Surfaces

July 4, 2008
Author(s)
Michael Nosonovsky, Bharat Bhushan
Non-adhesive and water-repellent surfaces are required for many tribological applications. Roughness-induced superhydrophobicty has been suggested as a way to reduce adhesion and stiction. In this paper, the theory of roughness-induced superhydrophobicity

Correlation Between Microstructure, Electronic Properties and Ficker Noise in Organic Thin Film Transistors

March 31, 2008
Author(s)
Oana Jurchescu, Behrang H. Hamadani, Hao Xiong, Sungkyu Park, Sankar Subramanian, Neil M. Zimmerman, John E. Anthony, Thomas Jackson, David J. Gundlach
We report on observations of a direct correlation between the microstructure of the organic thin films and their electronic properties when incorporated in field-effect transistors. We present a simple method to induce enhanced grain growth in solution

Magnetic Levitation System for the Dissemination of a Non-Artifact Based Kilogram

November 27, 2007
Author(s)
Zeina J. Kubarych, Patrick J. Abbott, Edwin R. Williams, Ruimin Liu, Vincent J. Lee
We describe a new approach to directly link air and vacuum mass measurements. This approach uses magnetic levitation along with vacuum and balance technology to realize vacuum mass measurements. It provides direct traceability to the International

Method for estimating the dielectric constant of natural gas mixtures

January 11, 2005
Author(s)
Allan H. Harvey, Eric Lemmon
A method is developed for calculating the static dielectric constant (relative permittivity) of fluid mixtures, with an emphasis on natural gas. The dielectric constant is calculated as a function of temperature, density, and composition; the density is

Workshop Summary Report: Scanning Probe Nanolithography Workshop

January 1, 2003
Author(s)
John A. Dagata, H Yokoyama, F Perez-murano
A workshop on Scanning Probe Microscope (SPM)-based Nanolithography was held at NIST Gaithersburg on November 24-25, 2003. The meeting was sponsored by the Precision Engineering Division, Manufacturing Engineering Laboratory, NIST, under a Research

Highly Charged Ions

January 1, 2001
Author(s)
John D. Gillaspy
This article reviews some of the fundamental properties of highly charged ions, the methods of producing them (with particular emphasis on table-top devices), and their use as a tool for both basic science and applied technology. Topics discussed include

Building a Question Answering Test Collection

July 1, 2000
Author(s)
Ellen M. Voorhees, D M. Tice
The TREC-8 Question Answering (QA) Track was the first large-scale evaluation of domain-independent question answering systems. In addition to fostering research on the QA task, the track was used to investigate whether the evaluation methodology used for
Displaying 1651 - 1675 of 2915
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