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Nanotechnology

Nanometrology

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Displaying 101 - 125 of 855

An energy-resolved atomic scanning probe

November 21, 2018
Author(s)
Daniel S. Gruss, Chih-Chun Chien, Julio T. Barreiro, Massimiliano Di Ventra, Michael P. Zwolak
The density of states is a concept that is ubiquitous in classical and quantum physics, since it quantifies the energy distribution of states available in a system. Spectroscopic means allow its measurement over the entirety of a system's energy spectrum

Particle tracking of microelectromechanical system performance and reliability

October 25, 2018
Author(s)
Craig R. Copeland, Craig D. McGray, Jon C. Geist, Samuel M. Stavis
Microelectromechanical systems (MEMS) that require contact of moving parts to implement complex functions have demonstrated critical limits of performance and reliability. Here, we advance a particle tracking method to measure MEMS motion in operando at

Metrology for the next generation of semiconductor devices

October 12, 2018
Author(s)
Ndubuisi G. Orji, Mustafa Badaroglu, Bryan M. Barnes, Carlos Beitia, Benjamin D. Bunday, Umberto Celano, Regis J. Kline, Mark Neisser, Yaw S. Obeng, Andras Vladar
The semiconductor industry continues to produce ever smaller devices that are ever more complex in shape and contain ever more types of materials. The ultimate sizes and functionality of these new devices will be affected by fundamental and engineering

Spatial Dimensions in Atomic Force Microscopy: Instruments, Effects, and Measurements

August 15, 2018
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Ichiko Misumi, Gaoliang Dai
Atomic force microscopes (AFMs) are commonly and broadly regarded as being capable of three dimensional imaging. However, conventional AFMs suffer from both significant functional constraints and imaging artifacts that render them less than fully three

Subnanometer localization accuracy in widefield optical microscopy

July 11, 2018
Author(s)
Craig R. Copeland, Jon C. Geist, Craig D. McGray, Vladimir A. Aksyuk, James A. Liddle, Bojan R. Ilic, Samuel M. Stavis
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a widespread issue - overconfidence in measurement results with nanoscale

Probing the Optical Properties and Strain-Tuning of Ultrathin Mo1-xWxTe2

March 21, 2018
Author(s)
Ozgur B. Aslan, Isha M. Datye, Michal J. Mleczko, Karen Lau, Sergiy Krylyuk, Alina Bruma, Irina Kalish, Albert Davydov, Eric Pop, Tony F. Heinz
Ultrathin transition metal dichalcogenides (TMDCs) have recently been extensively investigated to understand their electronic and optical properties. Here we study ultrathin Mo0.91W0.09Te2, a semiconducting alloy of MoTe2, using Raman, photoluminescence

Remote Bias Induced Electrostatic Force Microscopy for Subsurface Imaging

March 5, 2018
Author(s)
Joseph J. Kopanski, Lin You, Yaw S. Obeng
Contrast in electrostatic force microscopy (EFM) depends on the electrostatic force between the tip and sample. In the related technique, scanning Kelvin force microscopy (SKFM), contrast arises from the force due to the capacitance gradient with tip-to

Metastable morphological states of catalytic nanoparticles

March 1, 2018
Author(s)
Pin A. Lin, Bharath N. Natarajan, Michael P. Zwolak, Renu Sharma
During the catalytic synthesis of graphene, nanotubes, fibers, and other nanostructures, many intriguing phenomena occur, such as phase separation, precipitation, and processes similar to capillary action. The underlying mechanism of these processes and

Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy

January 25, 2018
Author(s)
Cedric J. Powell, Wolfgang Werner, Henryk Kalbe, Alexander Shard, David G. Castner
We assessed two approaches for determining shell thicknesses of core-shell nanoparticles (NPs) by X-ray photoelectron spectroscopy. These assessments were based on simulations of photoelectron peak intensities for Au-core/C-shell, C-core/Au-shell, Cu-core
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