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Nanotechnology

Nanometrology

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Displaying 126 - 150 of 866

Probing the Optical Properties and Strain-Tuning of Ultrathin Mo1-xWxTe2

March 21, 2018
Author(s)
Ozgur B. Aslan, Isha M. Datye, Michal J. Mleczko, Karen Lau, Sergiy Krylyuk, Alina Bruma, Irina Kalish, Albert Davydov, Eric Pop, Tony F. Heinz
Ultrathin transition metal dichalcogenides (TMDCs) have recently been extensively investigated to understand their electronic and optical properties. Here we study ultrathin Mo0.91W0.09Te2, a semiconducting alloy of MoTe2, using Raman, photoluminescence

Remote Bias Induced Electrostatic Force Microscopy for Subsurface Imaging

March 5, 2018
Author(s)
Joseph J. Kopanski, Lin You, Yaw S. Obeng
Contrast in electrostatic force microscopy (EFM) depends on the electrostatic force between the tip and sample. In the related technique, scanning Kelvin force microscopy (SKFM), contrast arises from the force due to the capacitance gradient with tip-to

Metastable morphological states of catalytic nanoparticles

March 1, 2018
Author(s)
Pin A. Lin, Bharath N. Natarajan, Michael P. Zwolak, Renu Sharma
During the catalytic synthesis of graphene, nanotubes, fibers, and other nanostructures, many intriguing phenomena occur, such as phase separation, precipitation, and processes similar to capillary action. The underlying mechanism of these processes and

Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy

January 25, 2018
Author(s)
Cedric J. Powell, Wolfgang Werner, Henryk Kalbe, Alexander Shard, David G. Castner
We assessed two approaches for determining shell thicknesses of core-shell nanoparticles (NPs) by X-ray photoelectron spectroscopy. These assessments were based on simulations of photoelectron peak intensities for Au-core/C-shell, C-core/Au-shell, Cu-core

Surface plasmon polariton laser based on a metallic trench Fabry-Perot resonator

October 6, 2017
Author(s)
Wenqi Zhu, Ting Xu, Haozhu Wang, Cheng Zhang, Parag B. Deotare, Amit K. Agrawal, Henri J. Lezec
Recent years have witnessed growing interest in the development of lasers with small footprint for their potential applications in small-volume sensing and on-chip optical communications. Surface-plasmons – electromagnetic modes evanescently confined to

Aperture Arrays for Subnanometer Calibration of Optical Microscopes

September 28, 2017
Author(s)
Craig Copeland, Craig McGray, Jon Geist, James Alexander Liddle, Robert Ilic, Samuel Stavis
We fabricate and test subresolution aperture arrays as calibration devices for optical localization microscopy. An array pitch with a relative uncertainty of approximately three parts in ten thousand enables magnification calibration with subnanometer

Update on Bio-refining and Nanocellulose Composite Materials Manufacturing

September 25, 2017
Author(s)
Michael T. Postek, Dianne L. Poster
Nanocellulose is a high value material that has gained increasing attention because of its high strength, stiff ness, unique photonic and piezoelectric properties, high stability and uniform structure. One of the factors limiting the potential of

Dimensional Measurement of Nanostructures with Scanning Electron Microscopy

September 20, 2017
Author(s)
Kristine A. Bertness
Scanning electron microscopy (SEM) is widely used for the measurement of dimensions of nanostructures. This document describes the calibration of SEM magnification using the ASTM E766-14 practice with NIST Reference Material (RM) 8820 and the calculation

3D Nanometrology Based on SEM Stereophotogrammetry

September 18, 2017
Author(s)
Vipin N. Tondare, John S. Villarrubia, Andras Vladar
Three-dimensional (3D) reconstruction of a sample surface from scanning electron microscope (SEM) images taken at two perspectives has been known for decades. However, this method has not been widely used in the semiconductor industry for 3D measurements

Chapter 6. Characterization of nanofiber devices

September 17, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
Previous chapters have introduced and described a variety of measurement techniques for RF nanoelectronic devices. Here, our objective is to work through an illustrative example that highlights strategies and challenges related to implementing a specific

Chapter 1. An introduction to radio frequency nanoelectronics

September 15, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
The field of radio frequency (RF) nanoelectronics focuses on the fundamental study and engineering of devices that are enabled by nanotechnology and operate within a frequency range from about 100 MHz to about 100 GHz. This range includes frequencies

Strain Measurement of 3D Structured Nanodevices by EBSD

August 20, 2017
Author(s)
William A. Osborn, Lawrence H. Friedman, Mark D. Vaudin
We present a new methodology to accurately measure strain magnitudes from 3D nanodevices using Electron Backscatter Diffraction (EBSD). Because the dimensions of features on these devices are smaller than the interaction volume for backscattered electrons
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