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Nanotechnology

Nanometrology

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  • Published Date
Displaying 126 - 150 of 855

Surface plasmon polariton laser based on a metallic trench Fabry-Perot resonator

October 6, 2017
Author(s)
Wenqi Zhu, Ting Xu, Haozhu Wang, Cheng Zhang, Parag B. Deotare, Amit K. Agrawal, Henri J. Lezec
Recent years have witnessed growing interest in the development of lasers with small footprint for their potential applications in small-volume sensing and on-chip optical communications. Surface-plasmons – electromagnetic modes evanescently confined to

Aperture Arrays for Subnanometer Calibration of Optical Microscopes

September 28, 2017
Author(s)
Craig Copeland, Craig McGray, Jon Geist, James Alexander Liddle, Robert Ilic, Samuel Stavis
We fabricate and test subresolution aperture arrays as calibration devices for optical localization microscopy. An array pitch with a relative uncertainty of approximately three parts in ten thousand enables magnification calibration with subnanometer

Update on Bio-refining and Nanocellulose Composite Materials Manufacturing

September 25, 2017
Author(s)
Michael T. Postek, Dianne L. Poster
Nanocellulose is a high value material that has gained increasing attention because of its high strength, stiff ness, unique photonic and piezoelectric properties, high stability and uniform structure. One of the factors limiting the potential of

Dimensional Measurement of Nanostructures with Scanning Electron Microscopy

September 20, 2017
Author(s)
Kristine A. Bertness
Scanning electron microscopy (SEM) is widely used for the measurement of dimensions of nanostructures. This document describes the calibration of SEM magnification using the ASTM E766-14 practice with NIST Reference Material (RM) 8820 and the calculation

3D Nanometrology Based on SEM Stereophotogrammetry

September 18, 2017
Author(s)
Vipin N. Tondare, John S. Villarrubia, Andras Vladar
Three-dimensional (3D) reconstruction of a sample surface from scanning electron microscope (SEM) images taken at two perspectives has been known for decades. However, this method has not been widely used in the semiconductor industry for 3D measurements

Chapter 6. Characterization of nanofiber devices

September 17, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
Previous chapters have introduced and described a variety of measurement techniques for RF nanoelectronic devices. Here, our objective is to work through an illustrative example that highlights strategies and challenges related to implementing a specific

Chapter 1. An introduction to radio frequency nanoelectronics

September 15, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
The field of radio frequency (RF) nanoelectronics focuses on the fundamental study and engineering of devices that are enabled by nanotechnology and operate within a frequency range from about 100 MHz to about 100 GHz. This range includes frequencies

Strain Measurement of 3D Structured Nanodevices by EBSD

August 20, 2017
Author(s)
William A. Osborn, Lawrence H. Friedman, Mark D. Vaudin
We present a new methodology to accurately measure strain magnitudes from 3D nanodevices using Electron Backscatter Diffraction (EBSD). Because the dimensions of features on these devices are smaller than the interaction volume for backscattered electrons

Interface Engineering for Nanoelectronics

August 16, 2017
Author(s)
Christina A. Hacker, Robert C. Bruce, Sujitra J. Pookpanratana
Innovation in the electronics industry is tied to interface engineering as devices increasingly incorporate new materials and shrink. Molecular layers offer a versatile means of tuning interfacial electronic, chemical, physical, and magnetic properties

Strain engineering a 4a*?3a charge-density-wave phase in transition-metal dichalcogenide 1T-VSe2

July 19, 2017
Author(s)
Duming Zhang, Jeonghoon Ha, Hongwoo H. Baek, Yang-Hao Chan, Donat F. Natterer, Alline Myers, Joshua D. Schumacher, William Cullen, Albert Davydov, Young Kuk, Mei-Yin Chou, Nikolai Zhitenev, Joseph A. Stroscio
We report a new charge density wave (CDW) structure in strained 1T-VSe2 thin films synthesized by molecular beam epitaxy. The CDW structure is unconventional and exhibits a rectangular 4a×√3a periodicity, as opposed to the previously reported hexagonal 4a

Quantitative characterization of gold nanoparticles by size-exclusion and hydrodynamic chromatography, coupled to inductively coupled plasma mass spectrometry and quasi-elastic light scattering

July 14, 2017
Author(s)
Leena M. Pitkanen, Antonio Montoro Bustos, Karen E. Murphy, Michael R. Winchester, Andre Striegel
The physicochemical characterization of nanoparticles, in general, and of gold nanoparticles (Au NPs), in particular, is of paramount importance for tailoring and optimizing the properties of these materials in specific applications, as well as for
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