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Critical dimension atomic force microscopy (CD-AFM) is a measurement technique that uses flared tips and two-dimensional surface sensing to enable scanning of features with near-vertical sidewalls. A major source of uncertainty in metrology with CD-AFM is
This NIST Special Publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011[1]. This Strategy identified a
Gaoliang Dai, Jens Fluegge, Harald Bosse, Ronald G. Dixson
This paper presents a bottom-up approach which uses the transmission electron microscopy (TEM) and the reference value of the crystal silicon lattice constant as a pathway for traceability to the SI metre for applications in dimensional nanometrology
Fereshte Ghahari Kermani, Daniel T. Walkup, Christopher Gutierrez, Joaquin R. Nieva, Yue Y. Zhao, Jonathan E. Wyrick, Donat F. Natterer, William G. Cullen, Kenji Watanabe, Takashi Taniguchi, Leonid Levitov, Nikolai B. Zhitenev, Joseph A. Stroscio
Berry phase is an example of anholonomy, where the phase of a quantum state may not return to its original value after its parameters cycle around a closed path; instead the quantum systems wavefunction may acquire a real measurable phase difference
Kai Hao, Lixiang Xu, Wu Fengcheng, Philip Nagler, Kha Tran, Xin Ma, Tobias Korn, Allan H. MacDonald, Xiaoqin Li, Galan Moody
The emerging field of valleytronics aims to exploit the valley pseudospin of electrons residing near Bloch band extrema as an information carrier. Recent experiments demonstrating optical generation and manipulation of exciton valley coherence (the
Pin Ann Lin, Jose Gomez-Ballesteros, Juan Burgos, Perla Balbuena, Bharath N. Natarajan, Renu Sharma
A heterogeneous catalyst usually works by letting the reactant adsorb onto its surface where the energies for specific bonds to dissociate and/or combine with other species (to form desired intermediate or final products) are lower. Rational catalyst
Gaoliang Dai, Kai Hahm, Harald Bosse, Ronald G. Dixson
International comparisons between National Metrology Institutes (NMIs) are important to verify measurement results and the associated uncertainties. In this paper, we report a comparison of the line width calibration of a crystal silicon line width
Gheorghe Stan, Richard S. Gates, Qichi Hu, Kevin Kjoller, Craig Prater, Alan Myers, Kanwal Singh, Ebony Mays, Sean W. King
The continued advancement of nanostructured materials and exploitation of nanoscale size effects will ultimately require understanding material structure-property relationships at the nanoscale. Despite a plethora of metrologies capable of characterizing
Yohan Yoon, Jungseok Chae, Aaron M. Katzenmeyer, Heayoung Yoon, Joshua D. Schumacher, Sang M. An, Andrea Centrone, Nikolai B. Zhitenev
Improving the power conversion efficiency of photovoltaic (PV) devices is challenging because the generation, separation and collection of electron-hole pairs in PV devices is strongly dependent on details of the nanoscale chemical composition and defects
Andrew J. Allen, Fan Zhang, Regis J. Kline, William F. Guthrie, Jan Ilavsky
The certification of a new standard reference material for small-angle scattering: NIST Standard Reference Material (SRM) 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering (SAXS), based on glassy carbon is presented. Creation
Electrical scanning probe microscopes (eSPMs), such as the scanning Kelvin force microscope (SKFM), scanning capacitance microscope (SCM), or various scanning microwave microscopes (SMMs) are sensitive to the electric field between the sample and tip
John S. Villarrubia, Vipin Tondare, Andras E. Vladar
Modern electronic devices are non-planar and have functional dependencies on device sizes in all three dimensions. Scanning electron microscope (SEM) images have spatial resolution at the needed nanometer level, but like most microscope images they are
Michael T. Postek, Andras E. Vladar, John S. Villarrubia
In many fields of research and production, a great deal of dimensional metrology, characterization and process control is accomplished using scanning electron microscopes (SEM). The accuracy of these SEM measurements has always been important, but is often
Georg Ramer, Florian Reisenbauer, Benedikt Steindl, Wolfgang Tomischko, Bernhard Lendl
Photothermal induced resonance (PTIR) is a method for optical spectroscopy that allows for infrared chemical imaging at spatial resolution below the limit of diffraction. By using the mechanical resonance of the cantilever for amplification the technique
Reference materials are essential tools to assure the quality of measurement results, from R&D labs to production facilities. They help increase the reliability of measurements, as laboratories can use reference materials to verify, for themselves, and
Bryan Calderon Jimenez, Monique E. Johnson, Antonio R. Montoro Bustos, Karen E. Murphy, Michael R. Winchester, Jose R. Vega Baudrit
Silver nanoparticles (AgNPs) show different physical and chemical properties compared to their macroscale analogs. This is primarily due to their small size and, consequently, the exceptional surface area of these materials. Presently, advances in the
A methodology to reconstruct a distributed force applied to an atomic force microscopy (AFM) cantilever given the shape in which it vibrates is developed. This is accomplished by rewriting Bernoulli Euler beam theory such that the force on the cantilever
Rohit J. Jacob, Diana Ortiz-Montalvo, Kyle R. Overdeep, Timothy P. Weihs, Michael R. Zachariah
Exothermic reactions between oxophilic metals and transition/ post transition metal-oxides have been well documented owing to their fast reaction time scales (10 μs). This article examines the extent of reaction in nano-aluminum based thermite systems
Samuel Berweger, Gordon A. MacDonald, Mengjin Yang, Kevin J. Coakley, Joeseph Berry, Kai Zhu, Frank W. DelRio, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
Tinh Nguyen, Elijah J. Petersen, Bastien T. Pellegrin, Justin M. Gorham, Thomas F. Lam, Minhua Zhao, Li Piin Sung
Carbon nanotubes (CNTs) are increasingly used in consumer and structural polymeric products to enhance a variety of properties. Under weathering, the polymer matrix will degrade and the nanofillers will potentially be released from the products, which
This article describes fabrication and operation of a microfabricated photonic waveguide loop probe for nondestructive evanescent coupling and localized testing of nanophotonic devices and circuits. A microfabricated 300 nm x 260 nm silicon (Si) waveguide
Jason K. Streit, Stephanie Lam, Yanmei Piao, Angela R. Hight Walker, Jeffrey A. Fagan, Ming Zheng
In this work, we introduce a new procedure for the efficient isolation and subsequent separation of double-wall carbon nanotubes (DWCNTs). A simplified rate zonal ultracentrifugation (RZU) process is first applied to obtain samples of highly enriched
Alexander Yulaev, Alexey Lipatov, Annie Xi Lu, Alexander Sinitskii, Leite Marina, Andrei Kolmakov
We demonstrate a technique for facile adhesion and encapsulation of micro- and nano objects on arbitrary substrates, stencils, and micro structured surfaces by ultrathin graphene oxide membranes via a simple drop casting of graphene oxide solution. A