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Nanotechnology

Nanometrology

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  • Published Date
Displaying 176 - 200 of 855

Origins and Demonstrations of Electrons with Orbital Angular Momentum

January 9, 2017
Author(s)
Benjamin McMorran, Amit Agrawal, Peter Ercius, Vincenzo Grillo, Andrew Herzing, Tyler R. Harvey, Martin Linck
The surprising message of the 1992 paper of Allen, Beijersbergen, Spreeuw, and Woerdman (ABSW) was that photons could exhibit orbital motion in free space, which subsequently launched advancements in optical manipulation, microscopy, quantum optics

Separation, Sizing, and Quantitation of Engineered Nanoparticles in an Organism Model Using Inductively Coupled Plasma Mass Spectrometry and Image Analysis

December 16, 2016
Author(s)
Monique E. Johnson, Shannon Hanna, Antonio R. Montoro Bustos, Christopher M. Sims, Lindsay C. Elliott, Babak Nikoobakht, John T. Elliott, Richard D. Holbrook, Keana C. Scott, Karen E. Murphy, Elijah J. Petersen, Lee L. Yu, Bryant C. Nelson, Akshay Lingayat, Adrian C. Johnston
For environmental studies assessing uptake of orally ingested engineered nanoparticles (ENPs), a key step in ensuring accurate quantification of ingested ENPs is efficient separation of the organism from ENPs that are either nonspecifically adsorbed to the

Contour Metrology using Critical Dimension Atomic Force Microscopy

December 15, 2016
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Boon Ping Ng, Andras Vladar, Michael T. Postek
The critical dimension atomic force microscope (CD-AFM) has been proposed as an instrument for contour measurement and verification – since its capabilities are complementary to the widely used scanning electron microscope (SEM). Although data from CD-AFM

In situ Atomic-Scale Probing of Reduction Dynamics of 2-Dimensional Fe2O3 Nanostructures

December 13, 2016
Author(s)
Wenhui Zhu, Jonathan P. Winterstein, Wei-Chang Yang, Lu Yuan, Renu Sharma, Guangwen Zhou
Atomic-scale structure dynamics and phase transformation pathway was probed, in situ, during the reduction of bi-crystalline Fe2O3 nanostructures in H2 by using an environmental transmission electron microscope. It was found that the reduction commenced

Electron Microscopy and Nanoscopy: Analytical

December 5, 2016
Author(s)
Vladimir P. Oleshko
The analytical electron microscope (AEM) is a transmission and/or scanning transmission electron microscope (S/TEM) which is modified to permit composition analyses using x-ray energy-dispersive spectroscopy (XEDS) and/or electron energy-loss spectroscopy

Characterization of Yttrium-Rich Precipitate Phases in a Titanium Alloy Weld

December 1, 2016
Author(s)
Andrew Herzing, Ratna P. Kolli, Sreeramamurthy Ankem
The yttrium-rich (Y-rich) precipitates that form in the fusion zone (FZ) of a Ti-5111 alloy weld were characterized by atom probe tomography and scanning transmission electron microscopy. Two distinct types of precipitates were identified: (1) a higher

Membrane-Based Environmental Cells for SEM in Liquids

December 1, 2016
Author(s)
Andrei A. Kolmakov
Environmental electron microscopy and Scanning Electron Microscopy (SEM) in liquids are among the most active research areas in modern electron microscopy and spectroscopy. Research interest in these techniques is broad as they are enabling the nanoscale

Study of Direct Lithiation of Thin Si Membranes with Spatially-Correlative Low Energy Focused Li Ion Beam and Analytical Electron Microscopy Techniques

November 22, 2016
Author(s)
Vladimir P. Oleshko, Christopher L. Soles, Kevin A. Twedt, J J. McClelland
Understanding and controlling defect interactions and transport properties of Li ions in silicon is crucial for the development of emerging technologies in energy storage and microelectronics. With a theoretical energy storage capacity of ~4200 mAhg-1

Comparison of CBED and ABF Atomic Imaging for GaN Polarity Determination

November 8, 2016
Author(s)
Alexana Roshko, Matthew D. Brubaker, Paul T. Blanchard, Kristine A. Bertness, Todd E. Harvey, Igor Levin, R.H. Geiss
A comparison of two electron microscopy techniques used to determine the polarity of GaN nanowires is presented. The techniques are convergent beam electron diffraction (CBED) in TEM mode and annular bright field (ABF) imaging in aberration corrected STEM

Tomography of a probe potential using atomic sensors on graphene

November 7, 2016
Author(s)
Jonathan E. Wyrick, Donat F. Natterer, Yue Y. Zhao, Kenji Watanabe, Takashi Taniguchi, William G. Cullen, Joseph A. Stroscio
One of the great advances in our ability to probe the quantum world has been the ability to manipulate the electronic structure of materials by constructing artificial nanostructures on surfaces using atomic manipulation of single adatoms with scanning

Transmission Electron Microscope Calibration Methods for Critical Dimension Standards

October 13, 2016
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Domingo I. Garcia-Gutierrez, Bunday Benjamin, M R. Bishop, Michael W. Cresswell, Richard A. Allen, John Allgair
One of the key challenges in critical dimension (CD) metrology is finding suitable dimensional calibration standards. The transmission electron microscope (TEM), which produces lattice-resolved images having scale traceability to the SI (International

Raman spectroscopy based measurements of carrier concentration in n-type GaN nanowires grown by plasma-assisted molecular beam epitaxy

September 30, 2016
Author(s)
Lawrence H. Robins, Elizabeth Horneber, Norman A. Sanford, Kristine A. Bertness, John B. Schlager
The carrier concentration in ensembles of n-type GaN nanowires (NWs) grown by plasma-assisted molecular beam epitaxy was determined by curve-fitting analysis of Raman spectra, based on modeling of the carrier concentration dependence of the longitudinal
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