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PUBLICATIONS

X-ray Metrology for Semiconductors

Published

Author(s)

Daniel F. Sunday, Regis J. Kline
Citation
Characterization and Metrology for Nanoelectronics
Publisher Info
Pan Stanford Publishing, Boca Raton, FL
Pub Type
Books
Nanometrology

Citation

Sunday, D. and Kline, R. (2016), X-ray Metrology for Semiconductors, Pan Stanford Publishing, Boca Raton, FL (Accessed April 26, 2024)

Created November 21, 2016, Updated March 23, 2017