Chapter 6. Characterization of nanofiber devices

Published

September 17, 2017

Author(s)

Thomas M. Wallis, Pavel Kabos

Abstract

Previous chapters have introduced and described a variety of measurement techniques for RF nanoelectronic devices. Here, our objective is to work through an illustrative example that highlights strategies and challenges related to implementing a specific RF nanoelectronic device measurement. To that end, this chapter will describe the broadband, two-port characterization of an individual nanofiber device (Here, a “nanofiber” is broadly defined to be any individual nanotube or nanowire, or a bundle of nanotubes or nanofiber). Historically, the electromagnetic characterization of individual carbon nanotubes at gigahertz frequencies was one of the first measurement challenges encountered in the relatively short history of RF nanoelectronics [1]-[4]. Interest in making accurate RF measurements of nanotubes has been driven largely by the potential uses of carbon nanotubes as high-quality interconnects in very large scale integrated circuits and as nano-antennas in communications applications [5]. In addition, such measurements were needed to investigate what influence, if any, the quantum capacitance and kinetic inductance have on the AC transport properties of carbon nanotubes [6]. The techniques that were developed for electromagnetic characterization of carbon nanotubes have subsequently been applied to additional nano-material systems, including semiconducting nanowires and graphene nanoribbons [7]-[9].

Citation

Measurement Techniques for RF Nanoelectronics

Publisher Info

Cambridge University Press, Cambridge, -1

Pub Type

Books

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Keywords

microwave measurements, nanoelectronics, nanowires

Citation

Wallis, T. and Kabos, P. (2017), Chapter 6. Characterization of nanofiber devices, Cambridge University Press, Cambridge, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920216 (Accessed March 13, 2025)