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Atomic Force Microscopy

Published

Author(s)

Jason P. Killgore, Teresa L. Kirschling

Abstract

N/A
Citation
Advances in Membrane Characterization
Publisher Info
Wiley, Hoboken, NJ

Keywords

Atomic Force Microscope, Membrane, Reverse Osmosis, Nanofiltration, Nafion

Citation

Killgore, J. and Kirschling, T. (2018), Atomic Force Microscopy, Advances in Membrane Characterization, Wiley, Hoboken, NJ, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914909 (Accessed May 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 11, 2018, Updated September 17, 2018