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Nanotechnology

Nanometrology

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Displaying 76 - 100 of 855

Unveiling defect-mediated charge-carrier recombination at the nanometer scale in polycrystalline solar cells

November 20, 2019
Author(s)
Yohan Yoon, Wei-Chang Yang, Dongheon Ha, Paul M. Haney, Daniel Hirsch, Heayoung Yoon, Renu Sharma, Nikolai Zhitenev
In this work, we employ two techniques, near-field scanning photocurrent microscopy (NSPM) and transmission electron microscope based cathodoluminescence spectroscopy (TEM-CL), to analyze the nanoscale electrical and optical properties of CdTe solar cells

Data-driven approaches to optical patterned defect detection

September 5, 2019
Author(s)
Mark-Alexander Henn, Hui Zhou, Bryan M. Barnes
Computer vision and classification methods have become increasingly popular in recent years due to ever-increasing computation power. While advances in semiconductor devices are the basis for this growth, few publications have probed the benefits of data

Interlaboratory comparison of nanoparticle size measurements between NMIJ and NIST using two different types of dynamic light scattering instruments

August 6, 2019
Author(s)
Kayori Takahashi, John A. Kramar, Natalia Farkas, Keiji Takahata, Ichiko Misumi, Kentaro Sugawara, Satoshi Gonda, Kensei Ehara
The question of how to relate particle sizes measured using a fixed-angle dynamic light scattering (DLS) instrument with those measured using a multi-angle DLS instrument is addressed. A series of nearly monodisperse polystyrene latex (PSL) particles with

Engineered Sulfur-MoS2-Graphene Heterostructure Cathodes for Diagnostics of Nanoscale Electrochemical Processes in High Energy Density Li-S Batteries

August 5, 2019
Author(s)
Vladimir P. Oleshko, William R. McGehee, Saya Takeuchi, Siyuan Zhang, Andrei A. Kolmakov, Jabez J. McClelland, Christopher L. Soles
Lithium-sulfur (Li-S) batteries have recently attracted enormous attention because of high theoretical specific energy (2600 Wh kg-1) and high specific capacity (1672 mAhg-1), as well as the low cost, natural abundance, and nontoxicity of elemental sulfur

Electron Reflectometry for Measuring Nanostructures on Opaque Substrate

July 8, 2019
Author(s)
Lawrence H. Friedman, Wen-Li Wu
Here, we present a method for measuring dimensions of nanostructures using specular reflection of electrons from an opaque surface. Development of this method has been motivated by measurement needs of the semiconductor industry, but it can also be more

Bubble magnetometry of nanoparticle heterogeneity and interaction

June 7, 2019
Author(s)
Andrew L. Balk, Ian J. Gilbert, R. Ivkov, John Unguris, Samuel Stavis
Bubbles have a rich history as transducers in particle-physics experiments. In a solid-state analogue, we use bubble domains in nanomagnetic films to measure magnetic nanoparticles. This technique can determine the magnetic orientation of a single

Bridging communities in the field of nanomedicine

April 30, 2019
Author(s)
Blanka Halamoda-Kenzaoui, Simon Baconnier, Thierry Bastogne, Didier Bazile, Patrick Boisseau, Gerrit Borchard, Sven E. Borgos, Luigi Calzolai, Karin Cederbrant, Gabriella di Felice, Tiziana Di Francesco, Marina Dobrovolskaia, Rog?rio Gaspar, Bel?n Gracia, Vincent A. Hackley, Lada Leyens, Neill Liptrott, Margriet Park, Anil Patri, Gert Roebben, Matthias Roesslein, Ren? Th?rmer, Patricia Urb?n L?pez, Val?rie Zuang, Susanne Bremer-Hoffmann
The workshop "Bridging communities in the field of nanomedicine" was hosted by the European Commission Joint Research Centre on 27-28 September 2017. It gathered experts from regulatory bodies, research institutions and industry to discuss the main

Spontaneous current constriction in threshold switching devices

April 9, 2019
Author(s)
Jonathan Goodwill, Georg Ramer, Dasheng Li, Brian Hoskins, Georges Pavlidis, Jabez J. McClelland, Andrea Centrone, James A. Bain, Marek Skowronski
Threshold switching devices exhibit extremely non-linear current-voltage characteristics, which are of increasing importance for a number of applications including solid-state memories and neuromorphic circuits. It has been proposed that such non-linear

Metrology requirements for next generation of semiconductor devices

April 4, 2019
Author(s)
Ndubuisi G. Orji
Although devices based on traditional CMOS architectures are expected to reach their physical limits in the next few years, the devices and materials involved are more complex and difficult to measure than ever before. The nanoscale sizes mean that the

Fast quantification of nanorod geometry by DMA-spICP-MS

February 18, 2019
Author(s)
Jiaojie Tan, Yong Yang, Hind El Hadri, Mingdong M. Li, Vincent A. Hackley, Michael R. Zachariah
A fast, quantitative method for determining the geometries of nanorods (i.e., length and dimeter) is described, based on hyphenation of differential mobility analysis (DMA) with single particle inductively coupled plasma mass spectrometry (spICP-MS). Seven

X-ray Metrology for the Semiconductor Industry Tutorial

February 1, 2019
Author(s)
Daniel F. Sunday, Wen-Li Wu, Scott Barton, Regis J. Kline
The semiconductor industry is in need of new, in-line dimensional metrology methods with higher spatial resolution for characterizing their next generation nanodevices. The purpose of this short course is to train the semiconductor industry on the NIST

Defect Evolution of Ion-Exposed Single-Wall Carbon Nanotubes

January 3, 2019
Author(s)
Jana Kalbacova, Elias J. Garratt, Raul D. Rodriguez, Angela R. Hight Walker, Kevin A. Twedt, Jeffrey Fagan, Teresa I. Madeira, Jabez J. McClelland, Babak Nikoobakht, Dietrich R. Zahn
A systematic evaluation of defects is essential to understand and engineer device properties and applications. Raman spectroscopy is employed for the characterization of carbon nanomaterials in particular to quantitatively evaluate defects from the

NIST Nanotechnology Environmental, Health, and Safety Research Program: 20092016

November 27, 2018
Author(s)
Debra L. Kaiser, Vincent A. Hackley
In response to needs of a government-wide initiative in nanotechnology led by a subcommittee within the White House’s Office of Science and Technology Policy, NIST established a nanotechnology environmental, health, and safety (nano-EHS) research program

Validation of Single Particle ICP-MS for Routine Measurements of Nanoparticle Size and Number Size Distribution

November 25, 2018
Author(s)
Antonio R. Montoro Bustos, Premsagar P. Kavuri, Antonio M. Possolo, Natalia Farkas, Andras Vladar, Karen E. Murphy, Michael R. Winchester
Single particle inductively coupled plasma-mass spectrometry (spICP-MS) is an emerging technique capable of measuring nanoparticle size and number concentration simultaneously, of metal-containing nanoparticles (NPs) at environmentally relevant levels
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