Current State of the Art in Small Mass and Force Metrology Within the International System of Units

Published

May 22, 2018

Author(s)

Gordon Shaw

Abstract

This review article summarizes new scientific trends in research for metrology of small mass (1 milligram and lower) and small force (10 micronewtons and lower). After a brief introduction to the field, this paper provides an overview of recent developments in methods that demonstrate traceability to the International System of Units (SI) with emphasis on the implications of redefining the kilogram in terms of Planck's constant. Specific research applications include new metrology facilities, calibration of small mass and force references such as milligram to submilligram masses or atomic force microscope (AFM) cantilevers, and laser power measurement using radiation pressure forces. Also discussed are recent scientific developments that may impact the field moving forward in the study of ultrasmall forces present in trapped and cooled quantum mechanical systems, resonant micro- and nanomechanical mass sensors, and other areas that potentially well suited for SI metrology. The work reviewed is not intended as a comprehensive review of all research in which small forces are measured, but rather as an overview of a field in which the accurate measurement of small mass and force with quantified uncertainty is the primary goal.

Citation

Measurement Science & Technology

Pub Type

Journals

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DOI Link

Keywords

mass, force, small mass and force, nanotechnology, SI, metrology, review

Citation

Shaw, G. (2018), Current State of the Art in Small Mass and Force Metrology Within the International System of Units, Measurement Science & Technology, [online], https://doi.org/10.1088/1361-6501/aaac51 (Accessed March 19, 2025)