NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Subsurface imaging of biased structures with electrostatic force microscopy (EFM)
Published
Author(s)
Lin You, Yaw S. Obeng, Joseph Kopanski
Abstract
In subsurface imaging applications, contrast in EFM depends on the electrostatic force between the tip and sample. In the related technique, scanning Kelvin force microscopy (SKFM) contrast arises from the force due to capacitance gradient with tip-to-sample distance (dC/dz). These measured quantities arise from variations in sample dielectric constant, any charge accumulated on subsurface structures, and subsurface variations in conductivity. Our technique allows us to independently bias the subsurface structures and thereby, separate the effect of buried charge and capacitance gradient.
Proceedings Title
Meeting Program of the 2018 Materials Research Society Meeting
Conference Dates
April 2-6, 2018
Conference Location
Phoenix, AZ, US
Conference Title
2018 Spring Meeting of the Materials Research Society
You, L.
, Obeng, Y.
and Kopanski, J.
(2018),
Subsurface imaging of biased structures with electrostatic force microscopy (EFM), Meeting Program of the 2018 Materials Research Society Meeting, Phoenix, AZ, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=924699
(Accessed October 11, 2025)