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Electronics

Electromagnetics

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Displaying 401 - 425 of 1580

NIST Tests of the Wireless Environment in Automobile Manufacturing Facilities

September 1, 2008
Author(s)
Catherine A. Remley, Galen H. Koepke, Chriss A. Grosvenor, John M. Ladbury, Dennis G. Camell, Jason B. Coder, Robert Johnk
This report describes tests carried out by members of the NIST Electromagnetics Division to study the wireless environment in automotive manufacturing facilities. Testing was performed at three facilities during 2006 and 2007. We studied an assembly plant

Electromagnetic Airframe Penetration Measurements of a Beechcraft Premier IA

August 1, 2008
Author(s)
Chriss A. Grosvenor, David R. Novotny, Dennis G. Camell, Galen H. Koepke, Robert Johnk
The National Institute of Standards and Technology has recently completed shielding effectiveness/penetration studies on three different aircraft types for the Federal Aviation Administration. The studies are used to understand the cavity coupling

Microwave Characterization of Semiconductors with a Split-Cylinder Cavity

August 1, 2008
Author(s)
Billy F. Riddle, James R. Baker-Jarvis, Michael D. Janezic
In this paper we demonstrate the use of a split-cylinder cavity for characterizing semiconductors over a temperature range of 173 K (-100oC) to 373 K (+100oC) at microwave frequencies (9-30 GHz). Complex permittivity measurements of silicon (Si) and

Chamber Imaging Using Spherical Near-Field Scanning

July 5, 2008
Author(s)
Ronald C. Wittmann, Michael H. Francis, Randy Direen
We discuss recent measurements performed at the National Institute of Standards and Technology (NIST) that were used to characterize the incident fields within a test volume and to produce images of the test chamber.

Near-field Scanning Measurements: Theory and practice

July 3, 2008
Author(s)
Michael H. Francis, Ronald C. Wittmann
This chapter summarizes theoretical and practical aspects of near-field scanning methods. These methods allow complete characterization of the transmitting or receiving properties using measurements made in close proximity to an antenna.

Evaluation of Nonlinear Distortion in ADCs Using Multisines

June 15, 2008
Author(s)
Catherine A. Remley, Nuno Carvalho, Pedro Cruz
This paper characterizes nonlinear distortion in an analog-to-digital converter (ADC) when it is excited by representative communication signals having non-constant time-domain envelopes. The effect of subjecting the ADC to signals that present a range of

ANTENNA TEST RANGE IMAGING USING SPHERICAL NEAR-FIELD SCANNING

June 8, 2008
Author(s)
Michael H. Francis, Ronald C. Wittmann, Randy Direen
Although the theory is straightforward, practical implementation of spherical near-field scanning for evaluating test chambers presents some significant challenges. Among these are the selection of an appropriate probe and the difficulty in minimizing

Calibrated Broadband Electrical Characterization of Nanowires

June 8, 2008
Author(s)
Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Hans Nembach, Kristine A. Bertness, Norman Sanford, Paul T. Blanchard, Pavel Kabos
A technique is presented for the broadband electrical characterization of nanowires. The technique relies on established on-wafer calibration methods as well as a direct measurement of the capacitive coupling that is in parallel with the nanowire

Permittivity and Permeability and the Basis of Effective Parameters

June 8, 2008
Author(s)
James R. Baker-Jarvis, Michael D. Janezic, Billy F. Riddle
The concepts of effective permittivity and permeability are used throughout the literature to describe both highly heterogeneous materials, inhomogeneous materials, and small collections of molecules. In this paper we study definitions of the permittivity

Uncertainty Analysis for Noise-Parameter Measurements

June 8, 2008
Author(s)
James P. Randa
A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave

Mixed Analog-Digital Instrumentation for Software-Defined-Radio Characterization

June 5, 2008
Author(s)
Catherine A. Remley, Nuno Carvalho, Pedro Cruz, Kevin Gard
This paper presents a new type of analog-digital mixed-domain instrument that is specially tailored for software defined radio characterization. The instrument allows the utilization of analog instruments such as vector signal analyzers and network

Radio Communications for Emergency Responders in High-Multipath Outdoor Environments

June 2, 2008
Author(s)
Catherine A. Remley, Galen H. Koepke, Christopher L. Holloway, Chriss A. Grosvenor, Dennis G. Camell
We present measurement data to support technology and standards development for broadband, digitally modulated radio communications used by emergency responders. Measurements were carried out at an oil refinery, representing a class of high-multipath

A Passive Heterodyne HEB Imager Operating at 850 GHz

May 15, 2008
Author(s)
Eyal Gerecht, Dazhen Gu, Lixing You, Sigfrid Yngvessen
We report the development and characterization of a passive heterodyne hot electron bolometer (HEB) imager operating at 850 GHz. HEB detectors provide unprecedented sensitivity and spectral resolution at terahertz frequencies covering the frequency range

Electromagnetic Airframe Penetration Measurements of the FAA's 737-200

May 2, 2008
Author(s)
Chriss A. Grosvenor, David R. Novotny, Dennis G. Camell, Galen H. Koepke, Robert Johnk, Seturnino Canales
The National Institute of Standards and Technology has completed shielding effectiveness/penetration studies on three different aircraft types for the Federal Aviation Administration. The studies are used to understand the cavity coupling characteristics

A z-component magneto-resistive sensor

April 8, 2008
Author(s)
Fabio C. da Silva, Sean Halloran, Lu Yuan, David P. Pappas
A thin-film sensor is described that measures the component of the magnetic field perpendicular to the plane of the substrate (also called the z-component field.) The sensors are fabricated on anisotropically etched, V-shaped groves on Si(100) substrates

Uncertainty Analysis for NIST Noise-Parameter Measurements

March 31, 2008
Author(s)
James P. Randa
The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the

Imaging with modular linear arrays of cryogenic Nb microbolometers

March 17, 2008
Author(s)
Erich N. Grossman, Charles Dietlein, Jon E. Bjarnason, Mabel Ramirez, M. Leivo, J. A. Penttila, P. Helisto, A. Luukanen
We present ultrawideband imagery obtained with modular, 8-element, superconducting Nb microbolometer arrays. Conically scanned images are presented and compared with raster-scanned images obtained on the same arrays and from similar NbN arrays at VTT

Spin Transfer Precessional Dynamics in Co 60 Fe 20 B 20 Nanocontacts

March 14, 2008
Author(s)
William H. Rippard, Matthew R. Pufall, Michael L. Schneider, Kevin Garello, Stephen E. Russek
We report on the precessional dynamics in spin transfer oscillators having Co 60Fe 20B 20 free layers as a function of annealing time at 225 °C. Repeated annealing reduces the critical current I c by roughly a factor of 3 and increases the tunability of
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