Randa, J.
(2008),
Uncertainty Analysis for NIST Noise-Parameter Measurements, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32951
(Accessed April 25, 2024)
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Uncertainty Analysis for NIST Noise-Parameter Measurements
Published
Author(s)
Abstract
The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters. An overview of the Monte Carlo program used to evaluate the type-B uncertainties is included.Citation
Technical Note (NIST TN) - 1530
Report Number
1530
NIST Pub Series
Pub Type
NIST Pubs
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Keywords
measurement uncertainty, noise measurement, noise figure, noise parameters, uncertainty
Citation
Created March 31, 2008, Updated January 27, 2020