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Uncertainty Analysis for NIST Noise-Parameter Measurements

Published

Author(s)

James P. Randa

Abstract

The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters. An overview of the Monte Carlo program used to evaluate the type-B uncertainties is included.
Citation
Technical Note (NIST TN) - 1530
Report Number
1530

Keywords

measurement uncertainty, noise measurement, noise figure, noise parameters, uncertainty

Citation

Randa, J. (2008), Uncertainty Analysis for NIST Noise-Parameter Measurements, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32951 (Accessed April 17, 2024)
Created March 31, 2008, Updated January 27, 2020