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Chamber Imaging Using Spherical Near-Field Scanning

Published

Author(s)

Ronald C. Wittmann, Michael H. Francis, Randy Direen

Abstract

We discuss recent measurements performed at the National Institute of Standards and Technology (NIST) that were used to characterize the incident fields within a test volume and to produce images of the test chamber.
Proceedings Title
2008 IEEE Antennas and Propagation Symposium Digest
Conference Dates
July 5-11, 2008
Conference Location
San Diego, CA
Conference Title
2008 IEEE Antennas and Propagation Society Symposium

Keywords

antenna measurements, imaging, spherical near-field scanning

Citation

Wittmann, R. , Francis, M. and Direen, R. (2008), Chamber Imaging Using Spherical Near-Field Scanning, 2008 IEEE Antennas and Propagation Symposium Digest, San Diego, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32927 (Accessed May 29, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 5, 2008, Updated January 27, 2020