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PUBLICATIONS

Uncertainty Analysis for Noise-Parameter Measurements

Published

Author(s)

James P. Randa

Abstract

A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.
Proceedings Title
CPEM 2008
Conference Dates
June 8-13, 2008
Conference Location
Broomfield, CO
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences

Download Paper

Local Download
Advanced communications, Electronics and Electromagnetics

Citation

Randa, J. (2008), Uncertainty Analysis for Noise-Parameter Measurements, CPEM 2008, Broomfield, CO, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32904 (Accessed October 14, 2025)

Issues

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Created June 8, 2008, Updated January 27, 2020
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