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Uncertainty Analysis for Noise-Parameter Measurements

Published

Author(s)

James P. Randa

Abstract

A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.
Proceedings Title
CPEM 2008
Conference Dates
June 8-13, 2008
Conference Location
Broomfield, CO
Conference Title
Conference on Precision Electromagnetic Measurements

Citation

Randa, J. (2008), Uncertainty Analysis for Noise-Parameter Measurements, CPEM 2008, Broomfield, CO, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32904 (Accessed May 26, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 8, 2008, Updated January 27, 2020