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EXPRESS-X Mapping of the PDM Enablers onto the PDM Schema

August 1, 2003

Author(s)

Katherine C. Morris

These views provide the data needed to create the objects defined in the the OMG PDM Enablers specification (PDME), ftp://ftp.omg.org/pub/docs/mfg/98-02-02.pdf

On the Measurement and Prediction of Temperature Fields in Machining AISI 1-45 Steel

July 1, 2003

Author(s)

Matthew A. Davies, Q Cao, A L. Cooke, Robert W. Ivester

Infrared microscopic measurements of the temperature fields at the tool-chip interface in steady-state, orthogonal, machining of AISI 1045 steel are presented

Measurement Techniques and Results of an Intercomparison of Horn Antenna Gain in IEC-R 320 at Frequencies of 26.5, 33.0 and 40.0 GHz

July 1, 2003

Author(s)

David Gentle, A. Beardmore, J. Achkar, J Park, Katherine MacReynolds, Jan P. deVreede

A measurement comparison of the boresight gain of two IEC-R320 horn antennas has been carried out between five national metrology laboratories at 26.5, 33 and

NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control

June 1, 2003

Author(s)

J Prins

This chapter presents techniques for monitoring and controlling processes and signaling when corrective actions are necessary. It covers both statistical

NIST/SEMATECH Engineering Statistics Handbook Chapter 8: Reliability

June 1, 2003

Author(s)

Alan Smeaton

In today's technological world nearly everyone depends upon the continued functioning of a wide array of complex machinery and equipment for their everyday

NIST/SEMATECH Engineering Statistics Handbook, Chapter 2: Measurement Process Characterization

June 1, 2003

Author(s)

C M. Croarkin

This chapter discusses the collection of data and associated statistical analyses for characterizing repeatability, reproducibility and stability of measurement

NIST/SEMATECH e-Handbook of Statistical Methods; Chapter 1: Exploratory Data Analysis

June 1, 2003

Author(s)

N. Alan Heckert, James J. Filliben

This chapter presents an approach/philosophy for data analysis which employs a variety of techniques (mostly graphical) to: maximize insight into a data set

MOBY, A Radiometric Buoy for Performance Monitoring and Vicarious Calibration of Satellite Ocean Color Sensors: Measurement and Data Analysis Protocols

June 1, 2003

Author(s)

D K. Clark, Marilyn Y. Murphy, M Yarbrough, M Feinholz, S Flora, W Broenkow, B. Carol Johnson, Steven W. Brown, Y S. Kim, J Mueller

The Marine Optical Buoy (MOBY) (Clark et al. 1997) is the centerpiece of the primary ocean measurement site for calibration of satellite ocean color sensors

Fingerprint Interoperability Standards

May 1, 2003

Author(s)

R. McCabe

The commercialization of the Automatic Fingerprint Identification System (AFIS) began in the mid 1970s with the installation of five systems at the FBI. In

High-Resolution Identifications of 1/2 Stacking Faults in Epitaxial Ba_0.3 Sr_0.7 Ti0₃ Thin Films

May 1, 2003

Author(s)

C J. Lu, Leonid A. Bendersky, K S. Chang, Ichiro Takeuchi

The near-interface region of an epitaxial Ba 0.3 Sr 0.7Ti0 3 thin film grows on (001) LaA10 3 was studied using transmission electron microscopy. The region was

Heat Release Rate Tests of Plastic Trash Containers

April 24, 2003

Author(s)

D W. Stroup, Daniel M. Madrzykowski

Two experiments were conducted to characterize the potential hazard from ignition of nominal 136 L (30 gal) trash containers made from high density polyethylene

2003 U.S. Government Biometrics Workshop: Overview and Summary

April 1, 2003

Author(s)

D M. Blackburn, R Lazarick, Calvin Miles, P. Jonathon Phillips, Fernando L. Podio

Overview and summary of the 2003 U.S. Government Biometrics Workshop, 9 April 2003. This document, and other associated information, can be found in the U.S

Scanning Probe Microscopes for the Electrical Characterization of Semiconductors

March 4, 2003

Author(s)

Joseph J. Kopanski

High Spatial Resolution Automatic Resistivity Mapping of Semiconductors

March 4, 2003

Author(s)

M W. Matarazzo, Joseph Kopanski

Selecting the Advanced Encryption Standard (AES): Raising the Bar for Cryptography.

March 1, 2003

Author(s)

William E. Burr

This paper describes how the National Institute of Standards and Technology (NIST) selected the Advanced Encryption Standard (AES), a new standard symmetric key

Exploring and Extending the Limits of CD-SEMs' Resolution

March 1, 2003

Author(s)

Andras Vladar, Michael T. Postek, John S. Villarrubia

This study of SEM resolution is occasioned by concerns that it is no longer adequate for lithography process control in integrated circuit manufacturing. For

Moisture measurements in semiconductor process gases using cavity ring-down spectroscopy

March 1, 2003

Author(s)

Kristine A. Bertness, Susan Y. Lehman, Joseph T. Hodges

We have demonstrated the use of cavity ring-down spectroscopy to measure water concentrations in the nmol/mol (ppb) range in nitrogen and phosphine gases. To

Sharing a Common Sense of Time

March 1, 2003

Author(s)

J C. Eidson, Kang B. Lee

Distributed measurement and control systems in which all components share a common sense of time allow significant decoupling of synchronization issues from

STIS Calibration Enhancement - Spectral Characterisation of Pt/Cr-Ne Hollow Cathode Lamps

March 1, 2003

Author(s)

F Kerber, Michael R. Rosa, Craig J. Sansonetti, Joseph Reader

STIS Calibration Enhancement - Spectral Characterization of PT/CR-NE Hollow Cathode Lamps

March 1, 2003

Author(s)

F Kerber, Michael R. Rosa, Craig J. Sansonetti, Joseph Reader

Wavelength calibration for the Space Telescope Imaging Spectrograph (STIS) on the Hubble Space Telescope is provided by an onboard Pt/Cr-Ne hollow cathode lamp

Magneto Transport Studies of Cr and Co-doped B-FeSi2 Grown by MBE

March 1, 2003

Author(s)

K Srikala, A Srujana, A Wadhawan, B P. Gorman, R J. Cottier, W Zhao, Chris L. Littler, J M. Perez, T D. Golding, Anthony G. Birdwell, W Henrion, M Rebien, P Stauss, R Glosser

Simbad A Calibration Using a Laser Based Facility and Comparison With Previous Techniques

February 1, 2003

Author(s)

N Souaidia, Steven W. Brown, Bettye C. Johnson

Two multi-channel filter radiometers were calibrated using three different techniques: against a lamp-illuminated integrating sphere source, against a laser

Measuring Local Optical Properties: Near-Field Polarimetry of Photonic Block Copolymer Morphology

January 10, 2003

Author(s)

Michael J. Fasolka, Lori S. Goldner, Jeeseong C. Hwang, A Urbas, P DeRege, T Swager, Edwin L. Thomas

Due to their microphase separated morphology, block copolymers (BC) can exhibit photonic behavior if their domain periodicity is sufficiently large (>100 nm) [1

Proposed System for Assuring Time and Frequency Coordination Among SIM Member Nations,

January 1, 2003

Author(s)

Michael A. Lombardi, John P. Lowe, Donald Sullivan

A Comparison of Laser-Based and Conventional Calibrations of Sun Photometers, ed. by G.S. Fargion and C.R. McClain

January 1, 2003

Author(s)

N Souaidia, C Pietras, Steven W. Brown, Bettye C. Johnson, G Fargion

The Use of Atomic Data in Applications Involving Ionizing Radiation, ed. by David R. Schultz, Predrag S. Krstic and Fay Ownby

January 1, 2003

Author(s)

Paul M. Bergstrom

NIST and Standards for Tissue Engineered Medical Products

January 1, 2003

Author(s)

John A. Tesk, Lisa R. Karam

Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research

January 1, 2003

Author(s)

Sangcheol Kim, A Sehgal, Alamgir Karim, Michael J. Fasolka

Measurement and Control Based on a Common Sense of Time using IEEE 1588

January 1, 2003

Author(s)

Kang B. Lee

Distributed measurement and control systems in which all components share a common sense of time allow significant decoupling of synchronization issues from

Quantum information processing in ion traps II

January 1, 2003

Author(s)

David J. Wineland

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