NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

NIST/SEMATECH Engineering Statistics Handbook, Chapter 2: Measurement Process Characterization

Published

Author(s)

C M. Croarkin

Abstract

This chapter discusses the collection of data and associated statistical analyses for characterizing repeatability, reproducibility and stability of measurement processes; controlling measurement processes; calibrating artifacts and instruments; and assessing uncertainties related to reported values. It involves several case studies with interactive software for analysis.
Citation
NIST/SEMATECH Engineering Statistics Handbook, Chapter 2: Measurement Process Characterization
Pub Type
Others

Keywords

calibration, gauge studies, measurement control, repeatability, reproducibility, stability, uncertainty

Citation

Croarkin, C. (2003), NIST/SEMATECH Engineering Statistics Handbook, Chapter 2: Measurement Process Characterization, NIST/SEMATECH Engineering Statistics Handbook, Chapter 2: Measurement Process Characterization (Accessed October 24, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created June 1, 2003, Updated February 17, 2017
Was this page helpful?