Croarkin, C.
(2003),
NIST/SEMATECH Engineering Statistics Handbook, Chapter 2: Measurement Process Characterization, NIST/SEMATECH Engineering Statistics Handbook, Chapter 2: Measurement Process Characterization (Accessed May 16, 2026)
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NIST/SEMATECH Engineering Statistics Handbook, Chapter 2: Measurement Process Characterization
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Abstract
This chapter discusses the collection of data and associated statistical analyses for characterizing repeatability, reproducibility and stability of measurement processes; controlling measurement processes; calibrating artifacts and instruments; and assessing uncertainties related to reported values. It involves several case studies with interactive software for analysis.Citation
NIST/SEMATECH Engineering Statistics Handbook, Chapter 2: Measurement Process Characterization
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Others
Keywords
calibration, gauge studies, measurement control, repeatability, reproducibility, stability, uncertainty
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Created June 1, 2003, Updated February 17, 2017