Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Scanning Probe Microscopes for the Electrical Characterization of Semiconductors

Published

Author(s)

Joseph J. Kopanski
Citation
Bulletin of the American Physical Society

Citation

Kopanski, J. (2003), Scanning Probe Microscopes for the Electrical Characterization of Semiconductors, Bulletin of the American Physical Society (Accessed June 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 4, 2003, Updated January 27, 2020