NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control

Published

Author(s)

J Prins

Abstract

This chapter presents techniques for monitoring and controlling processes and signaling when corrective actions are necessary. It covers both statistical process control (SPC) and statistical quality (SQC). SPC is based on a comparison of what is happening today with what happened previously to guarantee that process has not degraded. SQC is a technique for inspecting enough product from given lots to ensure a specified quality level.The chapter can be accessed via urlhttp://www.itl.nist.gov/div898/handbook/pmc/pmc.htm
Citation
NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control
Pub Type
Others

Keywords

acceptance sampling, capability indices, control charts, multivariate control, multivariate time, process control, time series

Citation

Prins, J. (2003), NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control, NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control (Accessed October 16, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created June 1, 2003, Updated February 17, 2017
Was this page helpful?