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NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control

Published

Author(s)

J Prins

Abstract

This chapter presents techniques for monitoring and controlling processes and signaling when corrective actions are necessary. It covers both statistical process control (SPC) and statistical quality (SQC). SPC is based on a comparison of what is happening today with what happened previously to guarantee that process has not degraded. SQC is a technique for inspecting enough product from given lots to ensure a specified quality level.The chapter can be accessed via urlhttp://www.itl.nist.gov/div898/handbook/pmc/pmc.htm
Citation
NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control

Keywords

acceptance sampling, capability indices, control charts, multivariate control, multivariate time, process control, time series

Citation

Prins, J. (2003), NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control, NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control (Accessed June 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 1, 2003, Updated February 17, 2017