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A new dielectric slit die sensor attached to the end of an extruder was designed to elucidate the melt properties of nylon 11 nanocomposites filled with...
A study is made of fracture from cyclic loading of WC spheres on the top surfaces of thick (1 mm) brittle layers on polymeric substrates, as representative of...
B D. Vogt, Christopher L. Soles, Hae-Jeong Lee, Eric K. Lin, Wen-Li Wu
The influence of substrate surface energy on the swelling of poly(vinyl pyrrolidone) (PVP) films was examined using x-ray reflectivity (XR) and quartz crystal...
John E. Kitching, Svenja A. Knappe, Li-Anne Liew, P Schwindt, V Shah, John M. Moreland, Leo W. Hollberg
We describe recent progress at NIST in the development of compact, low-power atomic frequency references based on microfabrication processes. The physics...
We have measured the stability of a variety of photodiodes as they are irradiated with UV light from a pulsed excimer laser source operating at 157 nm using a...
Near-field scanning optical microscopy and Fourier analysis polarimetry are combined to obtain quantitative maps of the local retardance, (resulting from strain...
Konrad W. Lehnert, A. M. Clark, William Duncan, Kent D. Irwin, Nathan A. Tomlin, Joel N. Ullom
We demonstrate hight bandwidth and low noise readout of a superconductor-insulator-normal metal-insulator superconductor hot electron bolometer element. We...
Qian Dong, Robert D. Chirico, Xinjian Yan, X Hong, Michael D. Frenkel
This paper reviews practices in the expression of uncertainty in the experimental literature for thermodynamic property measurements with determinations of...
We describe a frequency-stabilized cavity ring-down absorption spectrometer with automated scanning capabilities. The system utilizes the comb of ring-down...
Lloyd A. Currie, J D. Kessler, Robert A. Fletcher, J E. Dibb
Results are given from the NIST component of a pilot (winter-over) study of seasonal patterns of natural and anthropogenic species in air and snow transported...
C Dartigues, P Ghodous, Michael Gruninger, D Pallez, Ram D. Sriram
In a collaborative computer-supported engineering environment, the interoperation of various applications will need a representation that goes beyond the...
The Display Metrology Task Group of the Video Electronics Standards Association is developing the next Flat Panel Display Measurements Standard. The document's...
SOFM 2004 took place September 28-30, and was hosted by NIST's Optoelectronics Division in Boulder, Colorado, in cooperation with the Optical Society of America...
ckground: High concentration topical fluorides are commonly used to prevent caries in patients with compromised salivary function due to radiation and...
This paper has been presented as a plenary Lecture at the Eighteenth International Conference on Chemical Thermodynamics held August 17-20, 2004, in Beijing...
T Schaetz, Murray D. Barrett, Dietrich G. Leibfried, Joseph W. Britton, J Chiaverini, Wayne M. Itano, John D. Jost, E Knill, Christopher Langer, David J. Wineland
We investigate theoretically and experimentally how quantum state-detection efficiency is improved by the use of quantum information processing (QIP)...
This note concerns the mathematical aspects for several biometric algorithms in the recognition or identification problem. It is assumed that a biometric...