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Conferences

An Overview of the IEEE P1451 -- A Family of Proposed Smart Transducer Interface standards

April 1, 1998

Author(s)

Kang B. Lee

Sensors are used in a broad range of applications, from machinery condition monitoring and industrial automation to patient condition monitoring in hospitals

Critical Compilation of Atomic Wavelength and Energy Level Data,

April 1, 1998

Author(s)

William C. Martin

Advanced MMI/MP for Demo III XUVs

April 1, 1998

Author(s)

Stephen B. Balakirsky, M J. Salonish, S D. Allen, Elena R. Messina, J Salinas

This paper outlines the goals and work accomplished thus far for both the man-machine interface (MMI) and mission planning (MP) elements of the eXperimental

Anisotropic Microstructure of Plasma-Sprayed Deposits

April 1, 1998

Author(s)

J Ilavsky, Gabrielle G. Long, Andrew J. Allen, L Leblanc, M Prystay, C Moreau, Alan H. Band

The microstructure of plasma-sprayed deposits [PSD] is dominated by two void systems-interlamellar pores and intralamellar cracks - each with a different

Careers in Government: Bench Scientist to Policy Wonk

April 1, 1998

Author(s)

K B. Gebbie

The U.S. system for graduate education in physics is arguably the most effective system yet devised for advanced training in physics. Focused as it is on

Critical Compilation of Atomic Wavelength and Energy Level Data

April 1, 1998

Author(s)

William C. Martin, J Sugar, Arlene Musgrove, Craig J. Sansonetti, Jean E. Sansonetti, Edward B. Saloman, V I. Azarov, Alexander Kramida, A N. Ryabtsev, T Shirai

The Atomic Energy Levels Data Center at the National Institute of Standards and Technology (NIST), in cooperation with other laboratories indicated above, is

Wavelengths and Oscillator Strengths for Space Astronomy

April 1, 1998

Author(s)

Craig J. Sansonetti, Joseph Reader

Over a period of more than a decade the Atomic Spectroscopy Group at NIST has carried out laboratory research to support the observing program of the Hubble

RTP Calibration Wafer Using Thin-Film Thermocouples

April 1, 1998

Author(s)

Kenneth G. Kreider, D P. DeWitt, Benjamin K. Tsai, Francis J. Lovas, David W. Allen

Rapid thermal processing (RTP) is a key technology for the cluster tool, single wafer manufacturing approach that is used to produce integrated circuits at

A Novel Method to Determine the Mechanical Properties of Ultra-Thin Films

April 1, 1998

Author(s)

Christopher C. White, Wen-Li Wu

Recent experimental results based on x-ray reflectivity, ellipsometry and positron annihilation spectroscopy, etc. have demonstrated that physical properties of

X-Ray Diffraction Topography of Sapphire for Windows and Domes

March 30, 1998

Author(s)

David R. Black

X-ray diffraction topography has been used as a nondestructive characterization tool to investigate single-crystal sapphire for window and dome applications. A

A Method for Calibrating Ultrasonic Aluminum Reference Blocks with Nominally-Identical Ceramic-Element Transducers

March 27, 1998

Author(s)

John A. Slotwinski, Steven E. Fick, G V. Sydnor, Ana Lopez-Sanchez, Gerald V. Blessing

Ceramic-element transducers have been used successfully to calibrate aluminum flat-bottom-hole (FBH) reference blocks according to the American Society for

Network Security Testing Using Mobile Agents

March 25, 1998

Author(s)

Athanasios T. Karygiannis

This paper describes a prototype security testing tool that is currently under development at NIST. This prototype tool uses autonomous mobile agents to perform

Properties of Process Gases Determined Accurately with Acoustic Techniques

March 23, 1998

Author(s)

John J. Hurly

Pb-Distribution in a Five-Phase (Bi, Pd)-Sr-Ca-Cu-O Assemblage

March 12, 1998

Author(s)

Lawrence P. Cook, Winnie K. Wong-Ng

The partitioning of lead between phases in the nominal five-phase assemblage: (Pb,Bi) 3Sr 2Ca 2CuO x + (Ca,Sr) 2PbO 4 + (Bi,Pb) 2Sr 2CaCu 2O x + (Ca,Sr)O +

Cement Hydration in the Presence of Municipal Solid Waste Incineration Fly Ash.

March 5, 1998

Author(s)

Dale P. Bentz, S Remond, P Pimienta, J P. Bournazel

Incorporating wastes into concrete on an appropriately selective basis could help to solve some of the problems encountered in waste management. Some industrial

Modeling of Multi-Step Nonlinear Stress Relaxation in DGEBA/M-PDA Epoxy Resins

March 4, 1998

Author(s)

Gale A. Holmes, R C. Peterson, Donald L. Hunston

Multi-step stress relaxation data from a DGEBA/m-PDA epoxy resin is modeled using a nonseparable nonlinear constitutive equation. The form of the equation is

On the Bifurcation from Continuous to Segmented Chip Formation in Metal Cutting

March 4, 1998

Author(s)

Timothy J. Burns, Christopher J. Evans, Matthew A. Davies

We describe a new approach to modeling chip formation in orthogonal machining. Metal cutting is interpreted as a nonlinear dynamical process with

Interconnection Continuity Test for Packaged Functional Modules

March 3, 1998

Author(s)

Jan Obrzut

We developed an electrical test to evaluate interconnections in packaged, electrostatic-discharge (ESD) protected modules. The ESD protection circuit, which in

Accurate Size Measurement of Monosize Calibration Spheres by Differential Mobility Analysis

March 1, 1998

Author(s)

George W. Mulholland, Marco G. Fernandez

A differential mobility analyzer was used to measure the mean particle size of three monosize suspensions of polystyrene spheres in water. Key features of the

Cement Hydration in the Presence of Municipal Solid Waste Incineration of Fly Ash

March 1, 1998

Author(s)

S J. Remond, Dale P. Bentz, M. Pimpinella, J P. Bournazel

This study is part of a wider research program aimed at developing an assessment methodology of waste-containing concrete. This methodology is developed based

Assessment, Strengthening, and Repair Technologies for Buildings, Industrial Facilities, and Lifelines

March 1, 1998

Author(s)

Richard N. Wright

Experiences of catastrophic earthquakes such as San Francisco 1906, Kanto 1923, Northridge 1994, and Kobe 1995 show that great human and economic losses arise

Concrete: A Multi-Scale Interactive Composite

March 1, 1998

Author(s)

Edward J. Garboczi, Dale P. Bentz

Methods have been developed for predicting the overall diffusion coefficient of ions in concrete using a multi-scale interactive analysis, ignoring any chloride

Optical computer aided tomography measurements of plasma uniformity in an inductively coupled discharge, ed. by Seiler, D.G., Diebold, A.C., Bullis, W.M., Shaffner, T.J., McDonald, R., and Walters, E.J.

March 1, 1998

Author(s)

Eric C. Benck, J R. Roberts

High Sensitivity Technique for Measurement of Thin Film Out-of-Plane Expansion

March 1, 1998

Author(s)

Chad R. Snyder, F I. Mopsik

We have developed a technique utilizing a capacitance measurement for the accurate determination of the out-of-plane expansion of thin films on the order of 1

Optical Computer Aided Tomography of an Inductively Coupled Discharge

March 1, 1998

Author(s)

Eric C. Benck, J R. Roberts

Optical computer aided tomography (CAT) is being investigated as a potential in situ diagnostic for measuring plasma uniformity without making assumptions

Polarized Light Scattering and its Application to Microroughness, Particle, and Defect Detection

March 1, 1998

Author(s)

Thomas A. Germer

In this paper, I will discuss the theory and application of polarized light scatter. Recent measurements have shown that some sources of scatter, including

Tip Characterization for Scanned Probe Microscope Width Metrology

March 1, 1998

Author(s)

Samuel Dongmo, John S. Villarrubia, Samuel N. Jones, Thomas B. Renegar, Michael T. Postek, Jun-Feng Song

Determination of the tip shape is an important prerequisite for converting the various scanning probe microscopies form imaging tools into dimensional metrology

High-Resolution Microcalorimeter Energy-Dispersive Spectrometer for X-Ray Microanalysis and Particle Analysis

March 1, 1998

Author(s)

David A. Wollman, Gene C. Hilton, Kent D. Irwin, L L. Dulcie, Norman F. Bergren, Dale Newbury, K. S. Woo, B. H. Liu, Alain C. Diebold, John M. Martinis

Round Robin Determination of Power Spectral Densities of Different Si Wafer Surfaces

March 1, 1998

Author(s)

Egon Marx, I J. Malik, Y Strausser, T Bristow, N Poduje, J C. Stover

Power spectral densities (PSDs) were used to characterize a set of surfaces over a wide range of lateral as well as perpendicular dimensions. Twelve 200-mm

Thin-Film Ellipsometry Metrology

March 1, 1998

Author(s)

P. Durgapal, James R. Ehrstein, Nhan Van Nguyen

A wide variety of commercial ellipsometers are available in the market today. They all measure the change in the state of polarization of light on reflection

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