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Conferences

Spray Flame Characteristics for High-Temperature Gas-Assisted Atomization

May 1, 1998

Author(s)

Ashwani K. Gupta, M. Megerle, S R. Charagundla, Cary Presser

Design Guidelines for the Seismic Modification of Welded Steel Moment Frame Buildings

May 1, 1998

Author(s)

John L. Gross

Prompted by the widespread damage to welded beam-to-column connections as a result of the 1994 Northridge earthquake, the National Institute of Standards and...

Code Probability Distributions of A/D Converters with Random Input Noise

May 1, 1998

Author(s)

T. M. Souders

The specific architecture of an A/D converter influences the code probability distributions that result from random input noise. In particular, the ouput codes...

Flat Panel Display Measurements and Standards

May 1, 1998

Author(s)

Edward F. Kelley

Display metrology is discussed as applied to flat panel displays (FPDs). Topics include the importance of properset up, expected measurement uncertainty vs...

Physical Aging Behavior in Amorphous Pen Film as Measured by Creep

May 1, 1998

Author(s)

M L. Cerrada, G B. McKenna, J M. O'Reilly, J E. Greene, J R. Gillmor

Characterization of the viscoelastic and aging responses of poly [ethylene naphthalate] [PEN] is of increasing interest as this material begins to see greater...

A Hybrid Nonlinear Constitutive Model: Comparisons With Multiple Step Data for a Polyurethane Rubber

May 1, 1998

Author(s)

V Rouiller, G B. McKenna

A nonlinear constitutive equation based on the model of Bernstein, Kearsley and Zapas (BKZ) is developed by noting that the BKZ model has a structure that looks...

Determination of the Seebeck Coefficient of Thin-Film Thermocouples

May 1, 1998

Author(s)

Kenneth G. Kreider, Dean C. Ripple, D P. DeWitt

Thin-film thermocouples have been found useful in numerous applications ranging from thermal convertors, heat flux gages, and thermopiles to surface temperature...

A Fast Pulse Oscilloscope Calibration System

May 1, 1998

Author(s)

J. P. Deyst, Nicholas Paulter, T. Daboczi, Gerard N. Stenbakken, T. M. Souders

A system is described for calibrating high-bandwidth oscilloscopes using pulse signals. The fast pulse oscilloscope calibration system (FPOCS) is to be used to...

A Pulse Measurement Intercomparison

May 1, 1998

Author(s)

T. M. Souders, J R. Andrews, A. Caravone, J. P. Deyst, C. Duff, S. Naboicheck

A pulse measurement intercomparison, organized by (NIST) and conducted by the authors in their respective labs, is described. The purpose was to assess the...

Viewing Angle: A Matter of Perspective

May 1, 1998

Author(s)

T. G. Fiske, L. D. Silverstein, C. Penn, Edward F. Kelley

Setting viewing angle requirements and specifications for displays depends on how viewing angle is defined. There is significant confusion in the industry...

Small-Area Black Luminance Measurements on White Screen Using Replica Masks

May 1, 1998

Author(s)

Paul A. Boynton, Edward F. Kelley

Luminance measurements of small areas of black pixels on white-screen backgrounds are often used as metrics in display measurements, such as character-stroke...

Recent Advances in Metrology for the Electromagnetic Characterization of Bulk Materials at Microwave Frequencies

May 1, 1998

Author(s)

Jerzy Krupka, Claude Weil

Temperature Shift Factors for the Segmental Relaxation of Polycarbonate Below the Glass Transition

May 1, 1998

Author(s)

P A. O'Connell, G B. McKenna

Data are presented on the stress relaxation response of a polycarbonate under torsional load. Tests were performed for times long enough to attain the...

Cure, Shrinkage and Properties of an Epoxy Material

May 1, 1998

Author(s)

O Sindt, S L. Simon, G B. McKenna, E Liang

This work focuses on obtaining data to perform realistic finite element models of residual stresses in composite parts made of toughened epoxy thermosets. The...

A Nonlinear Fluid Standard Reference Material: Progress Report

May 1, 1998

Author(s)

Carl R. Schultesiz, G B. McKenna

NIST is in the process of developing a new Standard Reference Material that replaces the previous SRM 1490 Nonlinear Fluid Standard. The purpose of the material...

Trapped Ions, Entanglement, and Quantum Computing

May 1, 1998

Author(s)

C J. Myatt, B E. King, D Kielpinski, Dietrich Leibfried, C S. Turchette, Chris S. Wood, Wayne M. Itano, C Monroe, David J. Wineland

A miniature, elliptical ring rf (Paul) ion trap has been used in recent experiments toward realizing a quantum computer in a trapped ion system. With the...

Error Bars in Intensity and Phase Measurements of Ultrashort Laser Pulses

May 1, 1998

Author(s)

M. J. Munroe, David H. Christensen, R. Trebino

A Federal Public Key Infrastructure With Multiple Digital Signature Algorithms

April 22, 1998

Author(s)

William E. Burr, William T. Polk

Several digital algorithms are coming into general use. A certificate containing a key for one algorithm can be signed with a different algorithm. This paper...

NIST/NBS Fire Research and FRCA: 25 Years of Progress

April 16, 1998

Author(s)

Richard G. Gann

The National Bureau of Standards' Center for Fire Research and the Fire Retardant Chemicals Association were formed within a year of each other. The former has...

Critical Compilation of Atomic Wavelength and Energy Level Data

April 3, 1998

Author(s)

William C. Martin, J Sugar, Arlene Musgrove, Craig J. Sansonetti, Jean E. Sansonetti, Edward B. Saloman, V I. Azarov, Alexander Kramida, A N. Ryabsev, T Shirai

Automation Infrastructure System for a Robotic 30-Ton Bridge Crane

April 1, 1998

Author(s)

William C. Stone, L E. Pfeffer

This paper describes the sensing portion of a system used to convert an existing 30-ton high bay bridge crane to computer control for automated placement of...

The Microstructure of Portland Cement-Based Materials: Computer Simulation and Percolation Theory

April 1, 1998

Author(s)

Edward J. Garboczi, Dale P. Bentz

Cement-based materials are usually composites, where the matrix consists of cement paste. Cement paste is a material formed from the hydration reaction of...

An Overview of the IEEE P1451 -- A Family of Proposed Smart Transducer Interface standards

April 1, 1998

Author(s)

Kang B. Lee

Sensors are used in a broad range of applications, from machinery condition monitoring and industrial automation to patient condition monitoring in hospitals...

Critical Compilation of Atomic Wavelength and Energy Level Data,

April 1, 1998

Author(s)

William C. Martin

Advanced MMI/MP for Demo III XUVs

April 1, 1998

Author(s)

Stephen B. Balakirsky, M J. Salonish, S D. Allen, Elena R. Messina, J Salinas

This paper outlines the goals and work accomplished thus far for both the man-machine interface (MMI) and mission planning (MP) elements of the eXperimental...

Anisotropic Microstructure of Plasma-Sprayed Deposits

April 1, 1998

Author(s)

J Ilavsky, Gabrielle G. Long, Andrew J. Allen, L Leblanc, M Prystay, C Moreau, Alan H. Band

The microstructure of plasma-sprayed deposits [PSD] is dominated by two void systems-interlamellar pores and intralamellar cracks - each with a different...

Careers in Government: Bench Scientist to Policy Wonk

April 1, 1998

Author(s)

K B. Gebbie

The U.S. system for graduate education in physics is arguably the most effective system yet devised for advanced training in physics. Focused as it is on...

Critical Compilation of Atomic Wavelength and Energy Level Data

April 1, 1998

Author(s)

William C. Martin, J Sugar, Arlene Musgrove, Craig J. Sansonetti, Jean E. Sansonetti, Edward B. Saloman, V I. Azarov, Alexander Kramida, A N. Ryabtsev, T Shirai

The Atomic Energy Levels Data Center at the National Institute of Standards and Technology (NIST), in cooperation with other laboratories indicated above, is...

Wavelengths and Oscillator Strengths for Space Astronomy

April 1, 1998

Author(s)

Craig J. Sansonetti, Joseph Reader

Over a period of more than a decade the Atomic Spectroscopy Group at NIST has carried out laboratory research to support the observing program of the Hubble...

RTP Calibration Wafer Using Thin-Film Thermocouples

April 1, 1998

Author(s)

Kenneth G. Kreider, D P. DeWitt, Benjamin K. Tsai, Francis J. Lovas, David W. Allen

Rapid thermal processing (RTP) is a key technology for the cluster tool, single wafer manufacturing approach that is used to produce integrated circuits at...

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