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PUBLICATIONS

Accuracy of Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers

Published

Author(s)

Roger Marks, Jeffrey A. Jargon, D. K. Rytting

Abstract

Several lumped-element calibrations have been proposed for four-sampler vector network analyzers. This paper offers the first assessment of their accuracy in the face of imperfectly defined standards. We discover significant error and introduce a new calibration that offers demonstrably improved accuracy.
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Volume
3
Conference Dates
June 7-12, 1998
Conference Location
Baltimore, MD
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/MWSYM.1998.700656

Citation

Marks, R. , Jargon, J. and Rytting, D. (1998), Accuracy of Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers, Tech. Dig., IEEE MTT-S International Microwave Symposium, Baltimore, MD, [online], https://doi.org/10.1109/MWSYM.1998.700656 (Accessed December 6, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 1, 1998, Updated November 10, 2018