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Conferences

Advances in NIST Standard Rockwell Diamond Indenters

January 1, 1998

Author(s)

Jun-Feng Song, Samuel R. Low III, David J. Pitchure, Theodore V. Vorburger

Recent developments in standard hardness machines and microform calibration techniques have made it possible to establish a worldwide unified Rockwell hardness

Four-color matrix method for correction of tristimulus colorimeters - Part 2

January 1, 1998

Author(s)

Yoshihiro Ohno, Steven W. Brown

Parallel Beam Powder Diffractometry Using a Laboratory X-Ray Source

January 1, 1998

Author(s)

R Deslattes, J -. Staudenmann, Lawrence T. Hudson, Albert Henins, J P. Cline

Measurement Traceability of NIST Standard Rockwell Diamond Indenters

January 1, 1998

Author(s)

Jun-Feng Song, Samuel R. Low III, Walter S. Liggett Jr, David J. Pitchure, Theodore V. Vorburger

A metrology-based Rockwell hardness scale is established by a standard machine and a standard diamond indenter. Both must be established through force and

Realization of an IR Spectral Radiant Power Response Scale on a Cryogenic Bolometer

January 1, 1998

Author(s)

Alan L. Migdall, George P. Eppeldauer

Effects of Feature Orientation in Tomographic Reconstructions, ed. by Ian McNulty

January 1, 1998

Author(s)

A R. Kalukin, Zachary H. Levine, S P. Frigo, I McNulty, M Kuhn

Ultrasensitive detections of weak resonances Application to optical frequency standards

January 1, 1998

Author(s)

Jun Ye, L -. Ma, John L. Hall

Meeting RTP Temperature Accuracy Requirements: Measurement and Calibrations at NIST, ed. by M.C. Ozturk, F. Roozeboom, P.J. Timans, and S.H. Pas

January 1, 1998

Author(s)

Francis J. Lovas, Benjamin K. Tsai, Charles E. Gibson

Formal Verification of Secure Programs in the Presence of Side Effects

January 1, 1998

Author(s)

Paul E. Black, P J. Windley

Much software is written in industry standard programming languages, but these these languages often have complex semantics making them hard to formalize. For

Optical frequency standards: Progress and applications

January 1, 1998

Author(s)

John L. Hall, Jun Ye, L -. Ma, K R. Vogel, Tim P. Dinneen

Emittance of coated sapphire windows

January 1, 1998

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

Evolution of the Microstructure of Plasma-Sprayed Deposits During Heating

January 1, 1998

Author(s)

Gabrielle G. Long, Andrew J. Allen, J Ilavsky

The evolution of the void microstructure of yttria-stabilized zirconia [YSZ] plasma-sprayed deposits [PSD] was studied as a function of heating in air from room

Testing Displacement-Measuring Interferometer Systems

January 1, 1998

Author(s)

Jack A. Stone Jr., Martin Schroeck, Michael T. Stocker

We have made a study of one method for testing displacement-measuring interferometer systems, a modified back-to-back comparison, that automatically compensates

GPS Week Roll-Over and YK Compliance for NBS-Type Receivers, and Absolute Calibration of the NIST Primary Receiver

January 1, 1998

Author(s)

Victor S. Zhang, Marc A. Weiss, E Powers, R Loiler

InSb Working Standard Radiometers

January 1, 1998

Author(s)

George P. Eppeldauer, Alan L. Migdall, Leonard M. Hanssen

Active Cavity Radiometer Based on High-TC Superconductors

January 1, 1998

Author(s)

Joseph P. Rice, Raju V. Datla, Leila R. Vale, David A. Rudman, M L. Sing, D Robbes

To implement the detector-based radiometric scale in the new Medium Background infrared [MBIR] facility at the National Institute of Standards and Technology

Measurements of Formaldehyde Concentrations and Formation Rates in a Methane-Air, Non-Premixed Flame and Their Implications for Heat-Release Rate

January 1, 1998

Author(s)

M. P. Tolocka, J. H. Miller

TOTAL TDEV

January 1, 1998

Author(s)

Marc A. Weiss, David A. Howe

Optical Diagnostic Methods for Inorganic Transmissive Materials

January 1, 1998

Author(s)

Raju V. Datla, Leonard M. Hanssen, Editors

Spatial Uniformity in Chamber-Cleaning Plasmas Measured Using Planar Laser-Induced Fluorescence

January 1, 1998

Author(s)

Kristen L. Steffens, Mark A. Sobolewski

Planar laser-induced fluorescence (PLIF) measurements were made to determine 2-D spatial maps of CF 2 density as an indicatior of chemical uniformity in 92% CF

The Open Assembly Design Environment Project: An Architecture for Design Agent Interoperability

January 1, 1998

Author(s)

Steven Shooter, Walid Keirouz, Peter F. Hart, Kevin W. Lyons

The Open Assembly Design Environment (OpenADE)project is an initiative at the National Institute of Standards and Technology (NIST) to provide an integrated and

Correlation Between Upper and Lower Noise Sidebands

January 1, 1998

Author(s)

F L. Walls

Real Time NIST Reference Radiometry using the International Space Station

January 1, 1998

Author(s)

Raju V. Datla, Robert D. Saunders, Albert C. Parr

Synthesis and Characterization of Fe-Co Alloy Nanoparticles

January 1, 1998

Author(s)

John H. Scott

Influence of Environmental Factors on Hydrogen Maser Frequency Stability

January 1, 1998

Author(s)

Thomas E. Parker

²⁵²Cf Fission Neutron Transport Through an Iron Sphere, ed. by H.A. Abderrahim, P. D'hondt, and B. Osmera

January 1, 1998

Author(s)

Jeffrey S. Nico, J M. Adams, C M. Eisenhauer, David M. Gilliam, J A. Grundl

Study of the Gas Jet in a Close-Coupled Gas-Metal Atomizer

January 1, 1998

Author(s)

Pedro I. Espina, U Piomelli

Accurate Frequency Comparisons at the 1 {?} 10^-15 Level

January 1, 1998

Author(s)

Thomas E. Parker, David A. Howe, Marc A. Weiss

Large-Scale Dosimetry Using Dilute Methylene Blue Dye in Aqueous Solution

January 1, 1998

Author(s)

A Kov{aacute}cs, L Wojnaravits, C Kurucz, M Al-sheikhly, W L. Mclaughlin

Voltage Modulation Scanned Probe Oxidation (Abstract)

January 1, 1998

Author(s)

John A. Dagata, T Inoue, J Itoh, K Matsumoto, H Yokoyama

This talk describes methods for enhancing the growth rate and electrical characteristics of nanostructures produced on silicon and titanium substrates by

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