Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

X-ray Specular and Diffuse Scatter Characterization of Near Ideal Thin Film Multilayers on Various Substrates Produced by Dual Ion Beam Deposition

Published

Author(s)

J Pedulla, S M. Owens, R Deslattes
Proceedings Title
4th Intl. Conf. on Physics of X-Ray Multilayer Structures
Conference Dates
March 5, 1998
Conference Location
Brekenridge, CO
Conference Title
Proc. 4th Intl. Conf. on Physics of X-Ray Multilayer Structures

Citation

Pedulla, J. , Owens, S. and Deslattes, R. (1998), X-ray Specular and Diffuse Scatter Characterization of Near Ideal Thin Film Multilayers on Various Substrates Produced by Dual Ion Beam Deposition, 4th Intl. Conf. on Physics of X-Ray Multilayer Structures , Brekenridge, CO (Accessed June 19, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 1998, Updated February 17, 2017