NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
High Energy X-Ray Diffraction Technique for Monitoring Solidification of Single Crystal Castings
Published
Author(s)
D W. Fitting, W P. Dube, Thomas A. Siewert
Abstract
We developed a noninvasive x-ray technique to monitor the solidification of single-crystal castings. X-ray energies in the 150 keV to 320 keV range have sufficient energy for transmission x-ray diffraction to be performed on a 17 mm thick nickel-alloy specimen. We obtained Laue diffraction images from the mold-encased casting even through the x-ray path (over 1m) through a directional solidification furnace included a variety of intervening furnace components. The x-ray method was capable of sensing changes in the physical state of casting (liquid, solid) and measuring the fraction of solid in the region of dendritic solidification.
Proceedings Title
Nondestructive Characterization of Materials, International Symposium | 8th | |
Fitting, D.
, Dube, W.
and Siewert, T.
(1998),
High Energy X-Ray Diffraction Technique for Monitoring Solidification of Single Crystal Castings, Nondestructive Characterization of Materials, International Symposium | 8th | |, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851224
(Accessed October 20, 2025)