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G J. Long, David T. Read, Joseph D. McColskey, K Crago
The effects of temperature and duration of thermal treatments on the microstructure and mechanical properties of electrodeposited gold films were evaluated
Marla L. Dowell, Christopher L. Cromer, Richard D. Jones, Darryl A. Keenan, Thomas Scott
Current and future laser measurement services at 157, 193, and 248 nm will be reviewed. Laser power and energy measurements at 193 nm will be presented
Standardization and metrology are critical infrastructure needs for the MEMS industry. These needs incluse standard test structures and test methods, and
Joseph Kopanski, Jay F. Marchiando, Brian G. Rennex
The Scanning Capacitance Microscope (SCM) is a leading candidate for a metrology capable of measuring the two-dimensional (2-D) carrier profiles of cross
Allen R. Hefner Jr., Ranbir Singh, Jih-Sheng Lai, David W. Berning, Sebastien Bouche, Christophe C. Chapuy
The electrical performance of Silicon Carbide (SiC) diodes are evaluated and compared to commercially available Silicon (Si) diodes in the voltage range from
Bin Wang, John S. Suehle, Eric M. Vogel, J B. Bernstein
We studied the effects of stress interruption on the time-dependent dielectric breakdown (TDDB) Life distributions of 2.0 nm oxynitride gate dielectric films
John S. Suehle, Eric M. Vogel, Bin Wang, J B. Bernstein
A comprehensive time-dependent dielectric breakdown study was conducted on sub-3 nm SiO 2 films over a temperature range from 22 0C to 350 0C. Two breakdown
Allen R. Hefner Jr., David W. Berning, Jih-Sheng Lai, C Liu, Ranbir Singh
A newly developed Silicon Carbide (SiC) Merged PiN Schottky (MPS) diode combines the best features of both Schottky and PiN diodes to obtain low on-state
Richard A. Allen, Loren W. Linholm, Michael W. Cresswell, Colleen E. Hood
A technique has been developed to fabricate 100-nm CD reference features with I-line lithography by utilizing a unique characteristic of single-crystal silicon
Cubic L 1 and L 2 interpolating splines based on C 1 smooth piecewise cubic Sibson elements on a tensor-product grid are investigated. Computational tests were
Head tracking is an important primitive for smart environments and perceptual user interfaces where the poses and movements of body parts need to be determined
Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models
XML developers claim they do it. OASIS, NIST, and W3C are building it. And, standards often require it. What is it?Conformance is usually defined as a way to
Elizabeth N. Fong, Nenad Ivezic, Thomas R. Rhodes, Y Peng
The potential of agent-based systems has not been realized yet, in part, because of the lack of understanding of how the agent technology supports industrial
Stephen D. Ridder, Aaron N. Johnson, Pedro I. Espina, Frank S. Biancaniello, G J. DelCorso
The performance of a commercial gas-metal atomizer was studied using a number of previously published research techniques. initially the flow was visualized
The work of J.R. Rice has been central to developments in solid mechanics over the last thirty years. This volume collects 21 articles on deformation and
This paper is concerned with the formation of polychorinated organics in the gas phase in combustion systems. The results are derived from simulation studies
Dylan F. Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude
Chiara F. Ferraris, L Brower, C H. Ozyildirim, J A. Daczko
The slump test is widely used to evaluate the workability of Concrete. However it has serious drawbacks, especially for self-compacting concrete (SCC). Other
The emergence of quantum metrology is expressed in modern electrical standards, primarily through the Josephson effect and the quantum Hall effect. The
Jeffrey Jargon, P. Kirby, Kuldip Gupta, Lawrence P. Dunleavy, T. Weller
This paper demonstrates that on-wafer open-short-load-thru (OSLT) calibrations of vector network analyzers can be improved by applying artificial neural
We present a statistical theory for estimating the directive characteristics of unintentional emitters based on the electrical size of the device. We compare
Steven Deiker, James A. Chervenak, Gene C. Hilton, Martin Huber, Kent D. Irwin, John M. Martinis, Sae Woo Nam, David A. Wollman
Both the x-ray astrophysics and microanalysis communities have a need for large format arrays of high-spectral-resolution x-ray detectors. To meet this need, we
Harold Sanchez, J. Cioffi, H. Laiz, D. Bennett, H. Ferreira, R. Ortega, Nile M. Oldham, Mark E. Parker
An international comparison of dc and low-frequency electrical units conducted between 19 laboratories in 16 countries in the Americas is described. The