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Conferences

Radiated Power Measurements in Reverberation Chambers

December 1, 2000

Author(s)

Galen H. Koepke, John M. Ladbury

The electromagnetic reverberation chamber is widely used as a test facility to generate complex fields for interference and compatibility measurements. The

A Specification-Based Coverage Metric to Evaluate Test Sets

December 1, 2000

Author(s)

P E. Ammann, Paul E. Black

Software developers use a variety of methods, including both formal methods and testing, to argue that their systems are suitable components for high assurance

The IMS Mission Architecture for Distributed Manufacturing Simulation

December 1, 2000

Author(s)

Frank H. Riddick, Charles R. McLean

This paper presents an overview of a neutral reference architecture for integrating distributed manufacturing simulation systems with each other, with other

A Low Temperature STM Facility for the Study of Quantum and Spin Electronic Systems

November 15, 2000

Author(s)

Joseph A. Stroscio, Robert Celotta, Steven R. Blankenship, E Hudson, Aaron P. Fein

We describe an experimental system with the goal of providing new measurement capabilities for the study of quantum and spin electronic systems on the nanometer

An Assessment Standard for the Evaluation of Display Measurement Capabilities

November 1, 2000

Author(s)

John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno

A prototype display measurement assessment transfer standard (DMATS) is being developed by NIST to assist the display industry in standardizing measurement

Introduction to: Proceedings of ILAC 2000 Technical Conference for Laboratory Professionals

November 1, 2000

Author(s)

Belinda L. Collins

The biennial meeting of the International Laboratory Accreditation Cooperation, the ILAC 2000 Technical Conference, in Washington, DC, is co-hosted by NIST and

Network Management Under Incomplete Information on the Operational Environment

November 1, 2000

Author(s)

Vladimir V. Marbukh

This paper proposes an approach to network management under incomplete information on the operational environment. The approach employs a combination of the

Thermal-Infrared Scale Verifications at 10 um Using the NIST EOS TXR

November 1, 2000

Author(s)

Joseph P. Rice, S C. Bender, W H. Atkins

One element of a multi-year calibration program between NIST and the NASA EOS Project Science Office has been the development and deployment of a portable

Scanning Electron Microscopy in Concrete Petrography

November 1, 2000

Author(s)

Paul E. Stutzman

Scanning electron microscopy has distinct advantages for characterization of concrete, cement, and aggregate microstructure, and in the interpretation of causes

Use of Open Source Distribution for a Machine Tool Controller

November 1, 2000

Author(s)

William P. Shackleford, Frederick M. Proctor

In recent years a growing number of government and university labs, non-profit organizations and even a few for-profit corporations have found that making their

New Technology Enables Many-Fold Reduction in the Cost of Refreshable Braille Displays

November 1, 2000

Author(s)

John W. Roberts, Oliver T. Slattery, D W. Kardos, B Swope

By analysis of the primary cost factors for existing refreshable Braille displays, a team at NIST has pioneered a new technology that can reduce the cost of the

Spectral Data for Atoms and Ions

November 1, 2000

Author(s)

Joseph Reader

Progress continues on the development of databases for spectral properties of atoms and ions. Version 2.0 of the NIST Atomic Spectra Database (ASD) became

Characterization of Voids in Rutile Nanoparticles by Transmission Electron Microscopy

November 1, 2000

Author(s)

Shirley Turner

Rutile nanoparticles containing voids or cavities have been characterized using transmission electron microscopy. The general morphology of voids has been

A Web-Based Process/Material Advisory System

November 1, 2000

Author(s)

Y Chen, Satyandra K. Gupta, Shaw C. Feng

This paper describes a web-based process/material advisory system that can be used during conceptual design. Given a set of design requirements for a part

Improving the Uncertainty Analysis of NIST's Pulse Parameter Measurement Service

November 1, 2000

Author(s)

Nicholas Paulter, Donald R. Larson

A new uncertainty analysis is being performed for NIST's pulse parameter measurement service that represents the new pulse parameter measurement and extraction

Cryogenic IR/Optical/UV Fast Spectrophotometers for the Study of Time-Variable Astronomical Sources

November 1, 2000

Author(s)

Aaron J. Miller, B. Cabrera, R. W. Romani, John M. Martinis, Sae Woo Nam, David M. Weld, J. P. Castle

Our detectors are superconducting Transition-Edge Sensors that have been designed for photon counting in the energy (wavelength) range of 0.5 eV (2.5

Cross Comparison of Direct Strength Testing Techniques on Polysilicon Films

November 1, 2000

Author(s)

D A. LaVan, T Tsuchiya, G Coles, W G. Knauss, I Chasiotis, David T. Read

Several direct and indirect testing techniques to characterize the strength and distribution in strength of structural thin films have been developed with

Role of Ion-Beam Processing Time in the Formation and Growth of the High-Nitrogen Phase in Austenitic Stainless Steel

November 1, 2000

Author(s)

D L. Williamson, P J. Wilber, F R. Fickett, S Parascandola

A systematic series of AISI-316 stainless steel samples has been prepared as a function of exposure time to a nitrogen ion beam Times from 15 to 4 h were

Monte Carlo Simulation for Radiometric Temperature Measurement in Rapid Thermal Processing

November 1, 2000

Author(s)

Yong Zhou, Y J. Shen, Z M. Zhang, Benjamin K. Tsai, D P. DeWitt

This work employs a Monte Carlo method to study the radiative process in a rapid thermal processing (RTP) furnace. A true effective emissivity, accounting for

Simulation of Methanol Combustion in the NIST Reference Spray Combustor

November 1, 2000

Author(s)

D S. Crocker, M G. Giridharan, J F. Widmann, Cary Presser

This paper describes the simulation of methanol spray flame in the NIST reference spray combustion facility, which was predicited using a state-of-the-art

Information Modeling on Conceptual Design Integrated with Process Planning

November 1, 2000

Author(s)

Ram D. Sriram, Mike Pratt, Shaw C. Feng, Eugene Song

Information modeling is critical to the integration of conceptual design and process planning. An information model for conceptual design is provided in this

Lateral SiO_x Tunnel Barrier Formation for Si-Based Tunnel Transistor Using Scanned Probe Oxidation

November 1, 2000

Author(s)

K Morimoto, K Morita, K Ohnaka, John A. Dagata

Tunneling transistors designed with a lateral tunnel barrier between source and drain electrodes have attracted much attention recently as an approach to

Lateral SiOx Tunnel Barrier Formation for Si-based Tunnel Transistor Using Scanned Probe Oxidation

November 1, 2000

Author(s)

K Morimoto, L Morita, K Ohnaka, John A. Dagata

Tunneling transistors designed with a lateral tunnel barrier between source and drain electrodes have attracted much attention recently as an approach to

Sum Frequency Spectroscopy Studies of Adsorption of Additives on Metal/Electrolyte Interfaces

November 1, 2000

Author(s)

Clayton S. Yang, Lee J. Richter, Kimberly Briggman, John C. Stephenson, Thomas P. Moffat, Gery R. Stafford

In situ and ex situ VR-SFG studies of mercaptopropylsulfonate (MPSA) molecules adsorbed on metal/electrolyte interfaces prove the molecular conformation is

Remote Sensing Support at NIST

October 25, 2000

Author(s)

Bettye C. Johnson

This presentation to the Committee on Earth Observation Satellites Working Group on Calibration and Validation 17th Plenary Meeting covers radiometry and remote

Business Process Driven Framework for Defining an Access Control Service Based on Roles and Rules

October 19, 2000

Author(s)

Ramaswamy Chandramouli

Defining an Access Control Service for an enterprise application requires the choice of an access control model and a process for formulation of access decision

Display Metrology Seminar

October 16, 2000

Author(s)

Eric Kelley

Display metrology is discussed as applied to flat panel displays (FPDs). Particular attention is given to display reflection measurements and how display

Exploring the Role of Polymer Melt Viscosity in Melt Flow and Flammability Behavior

October 15, 2000

Author(s)

Thomas J. Ohlemiller, John R. Shields, Kathryn M. Butler, Belinda L. Collins, Momar D. Seck

Thermoplastic polymers are widely used in roles where molding facilitates cost effective, high volume applications. Such polymers exhibit uniquely complex

Mastering and Archiving Uncompressed Digital Video Test Materials

October 11, 2000

Author(s)

Charles D. Fenimore

This is a report on the status of a Society of Motion Picture and Television Engineers (SMPTE) Ad Hoc Group charged with creating a master set of images for

Comparison and Development of Absorption Peak Determination Algorithms for Wavelength Standards

October 1, 2000

Author(s)

C. J. Zhu, Leonard M. Hanssen

Several peak determination algorithms are described and compared using the spectra of a NIST wavelength / wavenumber standard reference material (SRM). These

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