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Conferences

Local Electrode Atom Probes: Prospects for 3D Atomic Scale Metrology Applications in the Semiconductor and Data Storage Industries

January 1, 2001

Author(s)

T F. Kelly, T T. Gribb, R L. Martens, D J. Larson, N Tabat, R J. Matyi, T J. Shaffner

X-Ray Metrology by Diffraction and Reflectivity

January 1, 2001

Author(s)

D K. Bowen, R Deslattes

Simulation Investigations of the Longitudinal Sawtooth Instability at SURF, ed. Peter W. Lucas and Sara Webber

January 1, 2001

Author(s)

K Harkay, Kyoungsik Kim, N Sereno

Simulation Investigations of the Longitudinal Sawtooth Instability at SURF, ed. Peter W. Lucas and Sara Webber

January 1, 2001

Author(s)

K Harkay, Kyoungsik Kim, N Sereno

Detection of Pinholes in Ultrathin Films by Magnetic Coupling

January 1, 2001

Author(s)

William F. Egelhoff Jr., L Gan, P J. Chen, Cedric J. Powell, Robert McMichael, R A. Fry

When two magnetic films are separated by a nonmagnetic film, pinholes in the nonmagnetic film can allow direct contact and, thereby, magnetic coupling between...

Microstructural and Mechanical Characterization of Electrodeposited Gold Films

January 1, 2001

Author(s)

G J. Long, David T. Read, Joseph D. McColskey, K Crago

The effects of temperature and duration of thermal treatments on the microstructure and mechanical properties of electrodeposited gold films were evaluated...

Tensile Creep in the Next Generation Silicon Nitride

January 1, 2001

Author(s)

F Lofaj, Sheldon M. Wiederhorn, Gabrielle G. Long, P R. Jemian

The tensile creep behavior of a Lu-containing silicon nitride (SN 281) was characterized in the temperature range of 1350oC to 1550oC for test periods up to...

Silica Nano-particle Filled Poly(ethylene-ran-hexene)/xylene Gels

January 1, 2001

Author(s)

Haonan Wang, Charles C. Han

Modeling Drop Size Distribution in Polymer Blend Injection Molding

January 1, 2001

Author(s)

Frederick R. Phelan Jr., Erik K. Hobbie, H Jeon, S C. Glotzer, Charles C. Han

Polymer-Clay Nanocomposite Materials, Solution and Bulk Properties

January 1, 2001

Author(s)

G Schmidt, A Nakatani, Paul Butler, V Ferreiro, Alamgir Karim, Charles C. Han

Application of Polymer Processing Methodologies in the Preparation of Scaffolds for Tissue Engineering

January 1, 2001

Author(s)

N. R. Washburn, Carl Simon Jr., Kimberlee Potter, Joy Dunkers, Alamgir Karim, Eric J. Amis

Comparative Study of Porous SOG Films with Different Non-Destructive Instrumentation

January 1, 2001

Author(s)

M R. Baklanov, E Kondoh, Eric K. Lin, D W. Gidley, V. J. Lee, K P. Mogilnikov, J N. Sun

Localizing a Fluorescent Dye to Probe the Buried Interfacial Chemistry

January 1, 2001

Author(s)

Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, J H. VanZanten, Joy Dunkers, Richard~undefined~undefined~undefined~undefined~undefined Parnas, D L. Woerdeman

Laser Diode Focal Activation of Polymer for New Uses in Genomics and Gene Expression Research by Combination of Laser Capture Microdissection with Medical Molecular Diagnostics

January 1, 2001

Author(s)

G Cantoni, R F. Bonner, A Malekafzali, Jack F. Douglas, Eric J. Amis, Alamgir Karim, A Sehgal

Hard X-Ray Spectrometers for NIF

January 1, 2001

Author(s)

J Seely, G Holland, Charles Brown, R Deslattes, Lawrence T. Hudson, P Bell, M Miller, C Back

A NIF core diagnostic instrument has been designed and will be fabricated to record x-ray spectra in the 1.1 to 20.1 keV energy range. The High-Energy...

Benchmark Database for Input and Validation of Spray Combustion Models: Inlet Air Characterization

January 1, 2001

Author(s)

J F. Widmann, Cary Presser, G Papadopoulos

A reference spray combustion facility has been constructed for the purpose of providing benchmark data to validate multiphase combustion models. The baseline...

Issues Related to Spray Combustion Modeling Validation

January 1, 2001

Author(s)

J F. Widmann, Cary Presser

Validation of CFD predictions for spray combustion application has been a challenging task due to difficulties in both modeling and experimental measurements...

A Decomposition-Based Approach to Layered Manufacturing

January 1, 2001

Author(s)

R Janardan, I Ilinkin, J Schwerdt, Miles E. Smid, J J. Majhi, Ram D. Sriram

This paper introduces a new approach for improving the performance and versatility of Layered Manufacturing (LM), which is an emerging technology that makes it...

Effect of Aluminum Flake Orientation on Coating Appearance

January 1, 2001

Author(s)

L Sung, Maria Nadal, M E. McKnight, Egon Marx, R Dutruc, B Laurenti

The orientation of platelet-like pigments in coatings is affected by the processing conditions resulting in appearance variations of the final product. A set of...

Challenges of Metrology and Characterization Measurements for ULSI Technology

January 1, 2001

Author(s)

David G. Seiler, Thomas J. Shaffner

Wavelength References for Wavelength Division Multiplexing

January 1, 2001

Author(s)

Sarah L. Gilbert, Tasshi Dennis, William C. Swann

We describe NIST research on wavelength standards for optical fiber communications. We have developed transfer standrds that can be used to calibrate...

New Developments in Deep Ultraviolet Laser Metrology for Photolithography

January 1, 2001

Author(s)

Marla L. Dowell, Christopher L. Cromer, Richard D. Jones, Darryl A. Keenan, Thomas Scott

Current and future laser measurement services at 157, 193, and 248 nm will be reviewed. Laser power and energy measurements at 193 nm will be presented...

Multimode Lasing at Room Temperature from InGaAs/GaAs Quantum Dot Lasers

January 1, 2001

Author(s)

Benjamin D. Klein, Kevin L. Silverman, Richard Mirin

We demonstrate InGaAs/GaAs quantuum dot lasers with multimode lasing at room temperature immediately above threshold. The lasing modes are separated by about...

Summary Proceedings: Legal Metrology Seminar for the Americas

January 1, 2001

Author(s)

S E. Chappell, Charles D. Ehrlich, Kenneth S. Butcher

This paper provides a report on the Legal Metrology Seminar for the Americas that was held in conjunction with the 85th annual meeting of the National...

MEMS Standardization

December 31, 2000

Author(s)

Michael Gaitan

Standardization and metrology are critical infrastructure needs for the MEMS industry. These needs incluse standard test structures and test methods, and...

Silicon Carbide Merged PiN Schottky Diode Switching Characteristics and Evaluation for Power Supply Applications

December 31, 2000

Author(s)

Allen R. Hefner Jr., David W. Berning, Jih-Sheng Lai, C Liu, Ranbir Singh

A newly developed Silicon Carbide (SiC) Merged PiN Schottky (MPS) diode combines the best features of both Schottky and PiN diodes to obtain low on-state...

Hg+ Optical Frequency Standard: Recent Progress

December 31, 2000

Author(s)

B. A. Young, R J. Rafac, James A. Beall, J. E. Cruz, Wayne M. Itano, David J. Wineland, J. C. Bergquist

A Novel Method for Fabricating CD Reference Materials with 100 nm Linewidths

December 31, 2000

Author(s)

Richard A. Allen, Loren W. Linholm, Michael W. Cresswell, Colleen E. Hood

A technique has been developed to fabricate 100-nm CD reference features with I-line lithography by utilizing a unique characteristic of single-crystal silicon...

Optical and Structural Studies of Compositional Inhomogeneity in Strain-Relaxed Indium Gallium Nitride Films

December 31, 2000

Author(s)

Larry Robins, J T. Armstrong, Ryna B. Marinenko, Mark D. Vaudin, Charles E. Bouldin, J C. Woicik, Albert J. Paul, W. R. Thurber

Linewidth Measurement Intercomparison on a BESOI Sample

December 31, 2000

Author(s)

A. E. Villarrubia, Andras Vladar, J R. Lowney, Michael T. Postek, Richard A. Allen, Michael W. Cresswell, Rathindra Ghoshtagore

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