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Conferences

Measurements of Static Noise in Display Images

Author(s)
John W. Roberts, Edward F. Kelley
The appearance of noise on a display is an important usability issue. Sources of noise include electrical interference, display driver artifacts, resampling...

Detection of Pinholes in Ultrathin Films by Magnetic Coupling

Author(s)
William F. Egelhoff Jr., L Gan, P J. Chen, Cedric J. Powell, Robert McMichael, R A. Fry
When two magnetic films are separated by a nonmagnetic film, pinholes in the nonmagnetic film can allow direct contact and, thereby, magnetic coupling between...

Tensile Creep in the Next Generation Silicon Nitride

Author(s)
F Lofaj, Sheldon M. Wiederhorn, Gabrielle G. Long, P R. Jemian
The tensile creep behavior of a Lu-containing silicon nitride (SN 281) was characterized in the temperature range of 1350oC to 1550oC for test periods up to...

Hard X-Ray Spectrometers for NIF

Author(s)
J Seely, G Holland, Charles Brown, R Deslattes, Lawrence T. Hudson, P Bell, M Miller, C Back
A NIF core diagnostic instrument has been designed and will be fabricated to record x-ray spectra in the 1.1 to 20.1 keV energy range. The High-Energy...

A Decomposition-Based Approach to Layered Manufacturing

Author(s)
R Janardan, I Ilinkin, J Schwerdt, Miles E. Smid, J J. Majhi, Ram D. Sriram
This paper introduces a new approach for improving the performance and versatility of Layered Manufacturing (LM), which is an emerging technology that makes it...
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