Kelley, E.
(2000),
Display Metrology Seminar, Proc., Society for Information Display (SID) Symposium on Vehicle Displays, Toronto, 1, CA
(Accessed April 4, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Display Metrology Seminar
Published
Author(s)
Eric Kelley
Abstract
Display metrology is discussed as applied to flat panel displays (FPDs). Particular attention is given to display reflection measurements and how display reflection cannot be modeled in a simplistic way. Other topics include expected measurement uncertainty vs. repeatability, problems in making accurate light measurements and veiling glare. The role played by measurement diagnostics is considered and encouragement is given to employ such diagnostics routinely.Proceedings Title
Proc., Society for Information Display (SID) Symposium on Vehicle Displays
Conference Dates
October 16-20, 2000
Conference Location
Toronto, 1, CA
Conference Title
Society for Information Display Symposium on Vehicular Display
Pub Type
Conferences
Keywords
display metrology, display reflection, flat panel displays, frustum masks, haze component, Lambertian component, specular component, veiling glare
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 15, 2000, Updated October 12, 2021