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Joseph Kopanski, Jay F. Marchiando, Brian G. Rennex
The Scanning Capacitance Microscope (SCM) is a leading candidate for a metrology capable of measuring the two-dimensional (2-D) carrier profiles of cross...
Allen R. Hefner Jr., Ranbir Singh, Jih-Sheng Lai, David W. Berning, Sebastien Bouche, Christophe C. Chapuy
The electrical performance of Silicon Carbide (SiC) diodes are evaluated and compared to commercially available Silicon (Si) diodes in the voltage range from...
Bin Wang, John S. Suehle, Eric M. Vogel, J B. Bernstein
We studied the effects of stress interruption on the time-dependent dielectric breakdown (TDDB) Life distributions of 2.0 nm oxynitride gate dielectric films...
John S. Suehle, Eric M. Vogel, Bin Wang, J B. Bernstein
A comprehensive time-dependent dielectric breakdown study was conducted on sub-3 nm SiO 2 films over a temperature range from 22 0C to 350 0C. Two breakdown...
Cubic L 1 and L 2 interpolating splines based on C 1 smooth piecewise cubic Sibson elements on a tensor-product grid are investigated. Computational tests were...
Head tracking is an important primitive for smart environments and perceptual user interfaces where the poses and movements of body parts need to be determined...
Chiara F. Ferraris, L Brower, C H. Ozyildirim, J A. Daczko
The slump test is widely used to evaluate the workability of Concrete. However it has serious drawbacks, especially for self-compacting concrete (SCC). Other...
The emergence of quantum metrology is expressed in modern electrical standards, primarily through the Josephson effect and the quantum Hall effect. The...
Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models...
XML developers claim they do it. OASIS, NIST, and W3C are building it. And, standards often require it. What is it?Conformance is usually defined as a way to...
Elizabeth N. Fong, Nenad Ivezic, Thomas R. Rhodes, Y Peng
The potential of agent-based systems has not been realized yet, in part, because of the lack of understanding of how the agent technology supports industrial...
Stephen D. Ridder, Aaron N. Johnson, Pedro I. Espina, Frank S. Biancaniello, G J. DelCorso
The performance of a commercial gas-metal atomizer was studied using a number of previously published research techniques. initially the flow was visualized...
The work of J.R. Rice has been central to developments in solid mechanics over the last thirty years. This volume collects 21 articles on deformation and...
This paper is concerned with the formation of polychorinated organics in the gas phase in combustion systems. The results are derived from simulation studies...
Dylan F. Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude...
Jeffrey Jargon, P. Kirby, Kuldip Gupta, Lawrence P. Dunleavy, T. Weller
This paper demonstrates that on-wafer open-short-load-thru (OSLT) calibrations of vector network analyzers can be improved by applying artificial neural...
Uwe Arz, Dylan Williams, Dave K. Walker, Hartmut Grabinski
In this paper we apply a broadband measurement method to determine the propagation characteristics of coupled-line structures fabricated in different...
We present a statistical theory for estimating the directive characteristics of unintentional emitters based on the electrical size of the device. We compare...
Steven Deiker, James A. Chervenak, Gene C. Hilton, Martin Huber, Kent D. Irwin, John M. Martinis, Sae Woo Nam, David A. Wollman
Both the x-ray astrophysics and microanalysis communities have a need for large format arrays of high-spectral-resolution x-ray detectors. To meet this need, we...
Harold Sanchez, J. Cioffi, H. Laiz, D. Bennett, H. Ferreira, R. Ortega, Nile M. Oldham, Mark E. Parker
An international comparison of dc and low-frequency electrical units conducted between 19 laboratories in 16 countries in the Americas is described. The...
The electromagnetic reverberation chamber is widely used as a test facility to generate complex fields for interference and compatibility measurements. The...
Software developers use a variety of methods, including both formal methods and testing, to argue that their systems are suitable components for high assurance...
This paper presents an overview of a neutral reference architecture for integrating distributed manufacturing simulation systems with each other, with other...
Joseph A. Stroscio, Robert Celotta, Steven R. Blankenship, E Hudson, Aaron P. Fein
We describe an experimental system with the goal of providing new measurement capabilities for the study of quantum and spin electronic systems on the nanometer...
John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno
A prototype display measurement assessment transfer standard (DMATS) is being developed by NIST to assist the display industry in standardizing measurement...
One element of a multi-year calibration program between NIST and the NASA EOS Project Science Office has been the development and deployment of a portable...
Scanning electron microscopy has distinct advantages for characterization of concrete, cement, and aggregate microstructure, and in the interpretation of causes...
In recent years a growing number of government and university labs, non-profit organizations and even a few for-profit corporations have found that making their...