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Conferences

Effect of Aluminum Flake Orientation on Coating Appearance

January 1, 2001

Author(s)

L Sung, Maria Nadal, M E. McKnight, Egon Marx, R Dutruc, B Laurenti

The orientation of platelet-like pigments in coatings is affected by the processing conditions resulting in appearance variations of the final product. A set of...

Challenges of Metrology and Characterization Measurements for ULSI Technology

January 1, 2001

Author(s)

David G. Seiler, Thomas J. Shaffner

Wavelength References for Wavelength Division Multiplexing

January 1, 2001

Author(s)

Sarah L. Gilbert, Tasshi Dennis, William C. Swann

We describe NIST research on wavelength standards for optical fiber communications. We have developed transfer standrds that can be used to calibrate...

New Developments in Deep Ultraviolet Laser Metrology for Photolithography

January 1, 2001

Author(s)

Marla L. Dowell, Christopher L. Cromer, Richard D. Jones, Darryl A. Keenan, Thomas Scott

Current and future laser measurement services at 157, 193, and 248 nm will be reviewed. Laser power and energy measurements at 193 nm will be presented...

Multimode Lasing at Room Temperature from InGaAs/GaAs Quantum Dot Lasers

January 1, 2001

Author(s)

Benjamin D. Klein, Kevin L. Silverman, Richard Mirin

We demonstrate InGaAs/GaAs quantuum dot lasers with multimode lasing at room temperature immediately above threshold. The lasing modes are separated by about...

Summary Proceedings: Legal Metrology Seminar for the Americas

January 1, 2001

Author(s)

S E. Chappell, Charles D. Ehrlich, Kenneth S. Butcher

This paper provides a report on the Legal Metrology Seminar for the Americas that was held in conjunction with the 85th annual meeting of the National...

MEMS Standardization

December 31, 2000

Author(s)

Michael Gaitan

Standardization and metrology are critical infrastructure needs for the MEMS industry. These needs incluse standard test structures and test methods, and...

Silicon Carbide Merged PiN Schottky Diode Switching Characteristics and Evaluation for Power Supply Applications

December 31, 2000

Author(s)

Allen R. Hefner Jr., David W. Berning, Jih-Sheng Lai, C Liu, Ranbir Singh

A newly developed Silicon Carbide (SiC) Merged PiN Schottky (MPS) diode combines the best features of both Schottky and PiN diodes to obtain low on-state...

Hg+ Optical Frequency Standard: Recent Progress

December 31, 2000

Author(s)

B. A. Young, R J. Rafac, James A. Beall, J. E. Cruz, Wayne M. Itano, David J. Wineland, J. C. Bergquist

A Novel Method for Fabricating CD Reference Materials with 100 nm Linewidths

December 31, 2000

Author(s)

Richard A. Allen, Loren W. Linholm, Michael W. Cresswell, Colleen E. Hood

A technique has been developed to fabricate 100-nm CD reference features with I-line lithography by utilizing a unique characteristic of single-crystal silicon...

Optical and Structural Studies of Compositional Inhomogeneity in Strain-Relaxed Indium Gallium Nitride Films

December 31, 2000

Author(s)

Larry Robins, J T. Armstrong, Ryna B. Marinenko, Mark D. Vaudin, Charles E. Bouldin, J C. Woicik, Albert J. Paul, W. R. Thurber

Linewidth Measurement Intercomparison on a BESOI Sample

December 31, 2000

Author(s)

A. E. Villarrubia, Andras Vladar, J R. Lowney, Michael T. Postek, Richard A. Allen, Michael W. Cresswell, Rathindra Ghoshtagore

Scanning Capacitance Microscopy for Measuring Device Carrier Profiles beyond the 100 nm Generation

December 31, 2000

Author(s)

Joseph Kopanski, Jay F. Marchiando, Brian G. Rennex

The Scanning Capacitance Microscope (SCM) is a leading candidate for a metrology capable of measuring the two-dimensional (2-D) carrier profiles of cross...

SiC Power Diodes Provide Breakthrough Performance for a Wide Range of Applications

December 31, 2000

Author(s)

Allen R. Hefner Jr., Ranbir Singh, Jih-Sheng Lai, David W. Berning, Sebastien Bouche, Christophe C. Chapuy

The electrical performance of Silicon Carbide (SiC) diodes are evaluated and compared to commercially available Silicon (Si) diodes in the voltage range from...

The Effect of Stress Interruption and Pulsed Biased Stress on Ultra-Thin Gate Dielectric Reliability

December 31, 2000

Author(s)

Bin Wang, John S. Suehle, Eric M. Vogel, J B. Bernstein

We studied the effects of stress interruption on the time-dependent dielectric breakdown (TDDB) Life distributions of 2.0 nm oxynitride gate dielectric films...

Temperature Dependence of Soft Breakdown and Wear-Out in Sub-3 nm SiO₂ Films

December 31, 2000

Author(s)

John S. Suehle, Eric M. Vogel, Bin Wang, J B. Bernstein

A comprehensive time-dependent dielectric breakdown study was conducted on sub-3 nm SiO 2 films over a temperature range from 22 0C to 350 0C. Two breakdown...

Pulse Tube Cryocoolers for Cooling Infrared Sensors

December 15, 2000

Author(s)

Ray Radebaugh

Multiresolution Representation of Urban Terrain By L^1^ Splines, L^2^ Splines, and Piecewise Planar Surfaces

December 11, 2000

Author(s)

J E. Lavery, David E. Gilsinn

Cubic L 1 and L 2 interpolating splines based on C 1 smooth piecewise cubic Sibson elements on a tensor-product grid are investigated. Computational tests were...

Head Tracking Using Stereo

December 6, 2000

Author(s)

D Russakoff, Martin Herman

Head tracking is an important primitive for smart environments and perceptual user interfaces where the poses and movements of body parts need to be determined...

Workability of Self-Compacting Concrete

December 1, 2000

Author(s)

Chiara F. Ferraris, L Brower, C H. Ozyildirim, J A. Daczko

The slump test is widely used to evaluate the workability of Concrete. However it has serious drawbacks, especially for self-compacting concrete (SCC). Other...

What Metrology Gains With Quantized Resistance Standards

December 1, 2000

Author(s)

Randolph E. Elmquist

The emergence of quantum metrology is expressed in modern electrical standards, primarily through the Josephson effect and the quantum Hall effect. The...

Lumped-Element Models for On-Wafer Calibration

December 1, 2000

Author(s)

Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley

We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models...

QED and the Fundamental Constants,

December 1, 2000

Author(s)

Peter J. Mohr, Barry N. Taylor

What Is This Thing Called Conformance?

December 1, 2000

Author(s)

Lynne S. Rosenthal, Mary C. Brady

XML developers claim they do it. OASIS, NIST, and W3C are building it. And, standards often require it. What is it?Conformance is usually defined as a way to...

Agent-Based Services for B2B Electronic Commerce

December 1, 2000

Author(s)

Elizabeth N. Fong, Nenad Ivezic, Thomas R. Rhodes, Y Peng

The potential of agent-based systems has not been realized yet, in part, because of the lack of understanding of how the agent technology supports industrial...

Optimization of an Annular Jet Commercial Gas-Metal Atomizer

December 1, 2000

Author(s)

Stephen D. Ridder, Aaron N. Johnson, Pedro I. Espina, Frank S. Biancaniello, G J. DelCorso

The performance of a commercial gas-metal atomizer was studied using a number of previously published research techniques. initially the flow was visualized...

Editor's Preface

December 1, 2000

Author(s)

Kalman D. Migler, S G. Hatzikiriakos

The work of J.R. Rice has been central to developments in solid mechanics over the last thirty years. This volume collects 21 articles on deformation and...

Chlorination in Combustion Systems

December 1, 2000

Author(s)

Wing Tsang, Valeri I. Babushok

This paper is concerned with the formation of polychorinated organics in the gas phase in combustion systems. The results are derived from simulation studies...

Mismatch Corrections for Electro-Optic Sampling Systems

December 1, 2000

Author(s)

Dylan F. Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan

We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude...

Modeling Load Variations with Artificial Neural Networks to Improve on Wafer OSLT Calibrations

December 1, 2000

Author(s)

Jeffrey Jargon, P. Kirby, Kuldip Gupta, Lawrence P. Dunleavy, T. Weller

This paper demonstrates that on-wafer open-short-load-thru (OSLT) calibrations of vector network analyzers can be improved by applying artificial neural...

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