David R. Novotny, Robert T. Johnk, Arthur Ondrejka
We present a method for evaluating broadband absorber in a non-ideal testing environment. Using broadband, short impulse TEM horns, a frequency-rich spectrum (equivalent pulse length < 0.5 ns) illuminates a sample of material under test and the reflections are recorded. Unwanted reflections from the sample edges, rom the sample edges, room environment, antenna and other systematic events are mathematically removed by a combination of time gating, background subtraction and systematic deconvolution. The result is an estimate of the reflection characteristics of the center at the sample.