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Activities of the International Organization for Standardization Technical Committee 202 Microbeam Analysis
Published
Author(s)
John A. Small
Abstract
In January of 1992 the ISO Council announced the acceptance of resolution 50/1991 establishing TC202 Microbeam Analysis. The China State Bureau of Technology Supervision (CSBTS) was appointed by the ISO council as secretariat of TC 202 and remains in this position at the current time. At the time of its formation, nine ISO member bodies agreed to act as voting or participating (P-members) and an additional 13 member bodies agreed to act as observers (O-members). The first meeting was held in Beijing, PRC in July 1992. The meeting attendance included representatives from Germany, China, Japan, and the U.S. At this meeting, the scope of this technical committee was defined as: Standardization in the field of microbeam analysis (measurement parameters, methods and reference materials) which uses electrons as an incident beam and electrons and photons as the detection signal. The purpose is to analyze the compositional and structural characteristics of solid materials. The volume of analysis will generally involve a depth up to 10 micrometers and a surface less than 100 square micrometers. In the future, consideration of other techniques may be included as these techniques mature and standards are required. Subsequent meetings have been held in Catania, Sicily; Guangzhou, China; London, U.K.; and Matsue, Japan.
Proceedings Title
International Union of Microbeam Analysis Societies, Cconference | | | IOP Publishing
Conference Dates
July 9-13, 2000
Conference Title
Microbeam Analysis 2000, Proceedings Institute of Physics Conference Series
Small, J.
(2000),
Activities of the International Organization for Standardization Technical Committee 202 Microbeam Analysis, International Union of Microbeam Analysis Societies, Cconference | | | IOP Publishing
(Accessed October 12, 2024)