Kaplan, S.
and Hanssen, L.
(2000),
Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements, Optical Diagnostic Methods for Inorganic Materials , Conference | 2nd | Optical Diagnostic Methods for Inorganic Materials II | SPIE
(Accessed April 24, 2025)
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Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements
Published
Author(s)
,
Abstract
A goniometric system is used in conjuction with an FT-IR (Fourier-Transform Infrared) spectrophotometer to perform reflectance and transmittance measurements as a function of angle of incidence from 12 to 80 . The input beam is polarized using a high-quality Ge reflective Brewster-angle polarizer, and is focussed onto the sample with an approximately f/50 geometry. The average angle of incidence is controlled to within 0.05 , and spectra are recorded for both s- and p-polarization over a wavelength range of 1.6 mm to 5.2 mm, using a photoconductive InSb detector. Measurements results are compared to the predictions of the Fresnel equations in order to assess the accuracy of the instrument.Proceedings Title
Optical Diagnostic Methods for Inorganic Materials , Conference | 2nd | Optical Diagnostic Methods for Inorganic Materials II | SPIE
Volume
4103
Conference Dates
August 3-4, 2000
Conference Title
Proceedings of SPIE--the International Society for Optical Engineering
Pub Type
Conferences
Keywords
index of refraction, infrared, polarization, reflectance, transmittance
Citation
Issues
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Created October 1, 2000, Updated June 2, 2021