Kaplan, S.
and Hanssen, L.
(2000),
Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements, Optical Diagnostic Methods for Inorganic Materials , Conference | 2nd | Optical Diagnostic Methods for Inorganic Materials II | SPIE
(Accessed December 3, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements
Published
Author(s)
,
Abstract
A goniometric system is used in conjuction with an FT-IR (Fourier-Transform Infrared) spectrophotometer to perform reflectance and transmittance measurements as a function of angle of incidence from 12 to 80 . The input beam is polarized using a high-quality Ge reflective Brewster-angle polarizer, and is focussed onto the sample with an approximately f/50 geometry. The average angle of incidence is controlled to within 0.05 , and spectra are recorded for both s- and p-polarization over a wavelength range of 1.6 mm to 5.2 mm, using a photoconductive InSb detector. Measurements results are compared to the predictions of the Fresnel equations in order to assess the accuracy of the instrument.Proceedings Title
Optical Diagnostic Methods for Inorganic Materials , Conference | 2nd | Optical Diagnostic Methods for Inorganic Materials II | SPIE
Volume
4103
Conference Dates
August 3-4, 2000
Conference Title
Proceedings of SPIE--the International Society for Optical Engineering
Pub Type
Conferences
Keywords
index of refraction, infrared, polarization, reflectance, transmittance
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 1, 2000, Updated June 2, 2021