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PUBLICATIONS

Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements

Published

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

Abstract

A goniometric system is used in conjuction with an FT-IR (Fourier-Transform Infrared) spectrophotometer to perform reflectance and transmittance measurements as a function of angle of incidence from 12 to 80 . The input beam is polarized using a high-quality Ge reflective Brewster-angle polarizer, and is focussed onto the sample with an approximately f/50 geometry. The average angle of incidence is controlled to within 0.05 , and spectra are recorded for both s- and p-polarization over a wavelength range of 1.6 mm to 5.2 mm, using a photoconductive InSb detector. Measurements results are compared to the predictions of the Fresnel equations in order to assess the accuracy of the instrument.
Proceedings Title
Optical Diagnostic Methods for Inorganic Materials , Conference | 2nd | Optical Diagnostic Methods for Inorganic Materials II | SPIE
Volume
4103
Conference Dates
August 3-4, 2000
Conference Title
Proceedings of SPIE--the International Society for Optical Engineering
Pub Type
Conferences

Keywords

index of refraction, infrared, polarization, reflectance, transmittance

Citation

Kaplan, S. and Hanssen, L. (2000), Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements, Optical Diagnostic Methods for Inorganic Materials , Conference | 2nd | Optical Diagnostic Methods for Inorganic Materials II | SPIE (Accessed May 28, 2023)

Created October 1, 2000, Updated June 2, 2021