TY  - CONF
AU  - Simon Kaplan
AU  - Leonard Hanssen
C2  - Optical Diagnostic Methods for Inorganic Materials , Conference | 2nd | Optical Diagnostic Methods for Inorganic Materials II | SPIE
DA  - 2000-10-01
LA  - en
M1  - 4103
PB  - Optical Diagnostic Methods for Inorganic Materials , Conference | 2nd | Optical Diagnostic Methods for Inorganic Materials II | SPIE
PY  - 2000
TI  - Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements
ER  -