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Conferences

High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers

December 1, 2000

Author(s)

Uwe Arz, Dylan Williams, Dave K. Walker, Hartmut Grabinski

In this paper we apply a broadband measurement method to determine the propagation characteristics of coupled-line structures fabricated in different...

Directivity of the Test Device in EMC Measurements¹

December 1, 2000

Author(s)

Galen H. Koepke, David A. Hill, John M. Ladbury

We present a statistical theory for estimating the directive characteristics of unintentional emitters based on the electrical size of the device. We compare...

Development of Arrays of TES X-ray Detectors

December 1, 2000

Author(s)

Steven Deiker, James A. Chervenak, Gene C. Hilton, Martin Huber, Kent D. Irwin, John M. Martinis, Sae Woo Nam, David A. Wollman

Both the x-ray astrophysics and microanalysis communities have a need for large format arrays of high-spectral-resolution x-ray detectors. To meet this need, we...

SIM Comparison of Electrical Units

December 1, 2000

Author(s)

Harold Sanchez, J. Cioffi, H. Laiz, D. Bennett, H. Ferreira, R. Ortega, Nile M. Oldham, Mark E. Parker

An international comparison of dc and low-frequency electrical units conducted between 19 laboratories in 16 countries in the Americas is described. The...

Radiated Power Measurements in Reverberation Chambers

December 1, 2000

Author(s)

Galen H. Koepke, John M. Ladbury

The electromagnetic reverberation chamber is widely used as a test facility to generate complex fields for interference and compatibility measurements. The...

A Specification-Based Coverage Metric to Evaluate Test Sets

December 1, 2000

Author(s)

P E. Ammann, Paul E. Black

Software developers use a variety of methods, including both formal methods and testing, to argue that their systems are suitable components for high assurance...

The IMS Mission Architecture for Distributed Manufacturing Simulation

December 1, 2000

Author(s)

Frank H. Riddick, Charles R. McLean

This paper presents an overview of a neutral reference architecture for integrating distributed manufacturing simulation systems with each other, with other...

A Low Temperature STM Facility for the Study of Quantum and Spin Electronic Systems

November 15, 2000

Author(s)

Joseph A. Stroscio, Robert Celotta, Steven R. Blankenship, E Hudson, Aaron P. Fein

We describe an experimental system with the goal of providing new measurement capabilities for the study of quantum and spin electronic systems on the nanometer...

An Assessment Standard for the Evaluation of Display Measurement Capabilities

November 1, 2000

Author(s)

John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno

A prototype display measurement assessment transfer standard (DMATS) is being developed by NIST to assist the display industry in standardizing measurement...

Thermal-Infrared Scale Verifications at 10 um Using the NIST EOS TXR

November 1, 2000

Author(s)

Joseph P. Rice, S C. Bender, W H. Atkins

One element of a multi-year calibration program between NIST and the NASA EOS Project Science Office has been the development and deployment of a portable...

Scanning Electron Microscopy in Concrete Petrography

November 1, 2000

Author(s)

Paul E. Stutzman

Scanning electron microscopy has distinct advantages for characterization of concrete, cement, and aggregate microstructure, and in the interpretation of causes...

Use of Open Source Distribution for a Machine Tool Controller

November 1, 2000

Author(s)

William P. Shackleford, Frederick M. Proctor

In recent years a growing number of government and university labs, non-profit organizations and even a few for-profit corporations have found that making their...

New Technology Enables Many-Fold Reduction in the Cost of Refreshable Braille Displays

November 1, 2000

Author(s)

John W. Roberts, Oliver T. Slattery, D W. Kardos, B Swope

By analysis of the primary cost factors for existing refreshable Braille displays, a team at NIST has pioneered a new technology that can reduce the cost of the...

Spectral Data for Atoms and Ions

November 1, 2000

Author(s)

Joseph Reader

Progress continues on the development of databases for spectral properties of atoms and ions. Version 2.0 of the NIST Atomic Spectra Database (ASD) became...

Characterization of Voids in Rutile Nanoparticles by Transmission Electron Microscopy

November 1, 2000

Author(s)

Shirley Turner

Rutile nanoparticles containing voids or cavities have been characterized using transmission electron microscopy. The general morphology of voids has been...

A Web-Based Process/Material Advisory System

November 1, 2000

Author(s)

Y Chen, Satyandra K. Gupta, Shaw C. Feng

This paper describes a web-based process/material advisory system that can be used during conceptual design. Given a set of design requirements for a part...

Introduction to: Proceedings of ILAC 2000 Technical Conference for Laboratory Professionals

November 1, 2000

Author(s)

Belinda L. Collins

The biennial meeting of the International Laboratory Accreditation Cooperation, the ILAC 2000 Technical Conference, in Washington, DC, is co-hosted by NIST and...

Network Management Under Incomplete Information on the Operational Environment

November 1, 2000

Author(s)

Vladimir V. Marbukh

This paper proposes an approach to network management under incomplete information on the operational environment. The approach employs a combination of the...

Sum Frequency Spectroscopy Studies of Adsorption of Additives on Metal/Electrolyte Interfaces

November 1, 2000

Author(s)

Clayton S. Yang, Lee J. Richter, Kimberly Briggman, John C. Stephenson, Thomas P. Moffat, Gery R. Stafford

In situ and ex situ VR-SFG studies of mercaptopropylsulfonate (MPSA) molecules adsorbed on metal/electrolyte interfaces prove the molecular conformation is...

Improving the Uncertainty Analysis of NIST's Pulse Parameter Measurement Service

November 1, 2000

Author(s)

Nicholas Paulter, Donald R. Larson

A new uncertainty analysis is being performed for NIST's pulse parameter measurement service that represents the new pulse parameter measurement and extraction...

Cryogenic IR/Optical/UV Fast Spectrophotometers for the Study of Time-Variable Astronomical Sources

November 1, 2000

Author(s)

Aaron J. Miller, B. Cabrera, R. W. Romani, John M. Martinis, Sae Woo Nam, David M. Weld, J. P. Castle

Our detectors are superconducting Transition-Edge Sensors that have been designed for photon counting in the energy (wavelength) range of 0.5 eV (2.5...

Cross Comparison of Direct Strength Testing Techniques on Polysilicon Films

November 1, 2000

Author(s)

D A. LaVan, T Tsuchiya, G Coles, W G. Knauss, I Chasiotis, David T. Read

Several direct and indirect testing techniques to characterize the strength and distribution in strength of structural thin films have been developed with...

Role of Ion-Beam Processing Time in the Formation and Growth of the High-Nitrogen Phase in Austenitic Stainless Steel

November 1, 2000

Author(s)

D L. Williamson, P J. Wilber, F R. Fickett, S Parascandola

A systematic series of AISI-316 stainless steel samples has been prepared as a function of exposure time to a nitrogen ion beam Times from 15 to 4 h were...

Monte Carlo Simulation for Radiometric Temperature Measurement in Rapid Thermal Processing

November 1, 2000

Author(s)

Yong Zhou, Y J. Shen, Z M. Zhang, Benjamin K. Tsai, D P. DeWitt

This work employs a Monte Carlo method to study the radiative process in a rapid thermal processing (RTP) furnace. A true effective emissivity, accounting for...

Simulation of Methanol Combustion in the NIST Reference Spray Combustor

November 1, 2000

Author(s)

D S. Crocker, M G. Giridharan, J F. Widmann, Cary Presser

This paper describes the simulation of methanol spray flame in the NIST reference spray combustion facility, which was predicited using a state-of-the-art...

Information Modeling on Conceptual Design Integrated with Process Planning

November 1, 2000

Author(s)

Ram D. Sriram, Mike Pratt, Shaw C. Feng, Eugene Song

Information modeling is critical to the integration of conceptual design and process planning. An information model for conceptual design is provided in this...

Lateral SiO_x Tunnel Barrier Formation for Si-Based Tunnel Transistor Using Scanned Probe Oxidation

November 1, 2000

Author(s)

K Morimoto, K Morita, K Ohnaka, John A. Dagata

Tunneling transistors designed with a lateral tunnel barrier between source and drain electrodes have attracted much attention recently as an approach to...

Lateral SiOx Tunnel Barrier Formation for Si-based Tunnel Transistor Using Scanned Probe Oxidation

November 1, 2000

Author(s)

K Morimoto, L Morita, K Ohnaka, John A. Dagata

Tunneling transistors designed with a lateral tunnel barrier between source and drain electrodes have attracted much attention recently as an approach to...

Remote Sensing Support at NIST

October 25, 2000

Author(s)

Bettye C. Johnson

This presentation to the Committee on Earth Observation Satellites Working Group on Calibration and Validation 17th Plenary Meeting covers radiometry and remote...

Business Process Driven Framework for Defining an Access Control Service Based on Roles and Rules

October 19, 2000

Author(s)

Ramaswamy Chandramouli

Defining an Access Control Service for an enterprise application requires the choice of an access control model and a process for formulation of access decision...

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