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J Seely, G Holland, Charles Brown, R Deslattes, Lawrence T. Hudson, P Bell, M Miller, C Back
A NIF core diagnostic instrument has been designed and will be fabricated to record x-ray spectra in the 1.1 to 20.1 keV energy range. The High-Energy...
A reference spray combustion facility has been constructed for the purpose of providing benchmark data to validate multiphase combustion models. The baseline...
Validation of CFD predictions for spray combustion application has been a challenging task due to difficulties in both modeling and experimental measurements...
R Janardan, I Ilinkin, J Schwerdt, Miles E. Smid, J J. Majhi, Ram D. Sriram
This paper introduces a new approach for improving the performance and versatility of Layered Manufacturing (LM), which is an emerging technology that makes it...
L Sung, Maria Nadal, M E. McKnight, Egon Marx, R Dutruc, B Laurenti
The orientation of platelet-like pigments in coatings is affected by the processing conditions resulting in appearance variations of the final product. A set of...
We describe NIST research on wavelength standards for optical fiber communications. We have developed transfer standrds that can be used to calibrate...
Marla L. Dowell, Christopher L. Cromer, Richard D. Jones, Darryl A. Keenan, Thomas Scott
Current and future laser measurement services at 157, 193, and 248 nm will be reviewed. Laser power and energy measurements at 193 nm will be presented...
Benjamin D. Klein, Kevin L. Silverman, Richard Mirin
We demonstrate InGaAs/GaAs quantuum dot lasers with multimode lasing at room temperature immediately above threshold. The lasing modes are separated by about...
S E. Chappell, Charles D. Ehrlich, Kenneth S. Butcher
This paper provides a report on the Legal Metrology Seminar for the Americas that was held in conjunction with the 85th annual meeting of the National...
Standardization and metrology are critical infrastructure needs for the MEMS industry. These needs incluse standard test structures and test methods, and...
Allen R. Hefner Jr., David W. Berning, Jih-Sheng Lai, C Liu, Ranbir Singh
A newly developed Silicon Carbide (SiC) Merged PiN Schottky (MPS) diode combines the best features of both Schottky and PiN diodes to obtain low on-state...
Richard A. Allen, Loren W. Linholm, Michael W. Cresswell, Colleen E. Hood
A technique has been developed to fabricate 100-nm CD reference features with I-line lithography by utilizing a unique characteristic of single-crystal silicon...
Joseph Kopanski, Jay F. Marchiando, Brian G. Rennex
The Scanning Capacitance Microscope (SCM) is a leading candidate for a metrology capable of measuring the two-dimensional (2-D) carrier profiles of cross...
Allen R. Hefner Jr., Ranbir Singh, Jih-Sheng Lai, David W. Berning, Sebastien Bouche, Christophe C. Chapuy
The electrical performance of Silicon Carbide (SiC) diodes are evaluated and compared to commercially available Silicon (Si) diodes in the voltage range from...
Bin Wang, John S. Suehle, Eric M. Vogel, J B. Bernstein
We studied the effects of stress interruption on the time-dependent dielectric breakdown (TDDB) Life distributions of 2.0 nm oxynitride gate dielectric films...
John S. Suehle, Eric M. Vogel, Bin Wang, J B. Bernstein
A comprehensive time-dependent dielectric breakdown study was conducted on sub-3 nm SiO 2 films over a temperature range from 22 0C to 350 0C. Two breakdown...
Cubic L 1 and L 2 interpolating splines based on C 1 smooth piecewise cubic Sibson elements on a tensor-product grid are investigated. Computational tests were...
Head tracking is an important primitive for smart environments and perceptual user interfaces where the poses and movements of body parts need to be determined...
Chiara F. Ferraris, L Brower, C H. Ozyildirim, J A. Daczko
The slump test is widely used to evaluate the workability of Concrete. However it has serious drawbacks, especially for self-compacting concrete (SCC). Other...
The emergence of quantum metrology is expressed in modern electrical standards, primarily through the Josephson effect and the quantum Hall effect. The...
Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models...
XML developers claim they do it. OASIS, NIST, and W3C are building it. And, standards often require it. What is it?Conformance is usually defined as a way to...
Elizabeth N. Fong, Nenad Ivezic, Thomas R. Rhodes, Y Peng
The potential of agent-based systems has not been realized yet, in part, because of the lack of understanding of how the agent technology supports industrial...