Summary Proceedings: Legal Metrology Seminar for the Americas

Published

January 1, 2001

Author(s)

S E. Chappell, Charles D. Ehrlich, Kenneth S. Butcher

Abstract

This paper provides a report on the Legal Metrology Seminar for the Americas that was held in conjunction with the 85th annual meeting of the National Conference on Weights and Measures (NCWM) in Richmond, VA, from July 16 through July 20, 2000. The objectives of the seminar were to discuss legal metrology practices and capabilities for type evaluation and approval of measuring instruments and devices and the legal requirements for prepackaged products. The discussions took into consideration developments internationally as well as in other regions of the world. Relevant issues were raised and addressed through both formal presentations and an open dialogue among participants, and, as a consequence, specific opportunities for mutually beneficial actions within the Americas were identified for future consideration.

Proceedings Title

OIML Bulletin, Quarterly Journal of the International Organization of Legal Metrology (OIML)

Volume

XLII

Issue

No. 1

Conference Dates

July 16-20, 2000

Conference Location

Undefined

Conference Title

International Organization of Legal Metrology (OIML)

Pub Type

Conferences

Keywords

instrument certification, instrument verification, labeling and net content of packages, legal metrology, measuring instruments and devices, type evaluation

Citation

Chappell, S. , Ehrlich, C. and Butcher, K. (2001), Summary Proceedings: Legal Metrology Seminar for the Americas, OIML Bulletin, Quarterly Journal of the International Organization of Legal Metrology (OIML), Undefined (Accessed April 16, 2024)