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Conferences

Atomic Level Surface Metrology

Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Jun-Feng Song, Thomas Brian Renegar, Joseph Fu, Ndubuisi George Orji, V W. Tsai, E. C. Williams, H Edwards, D Cook, P West, R Nyffenegger
MotivationSemiconductor wafers and many types of optical elementsrequire ultra-smooth surfaces in order to functionas specifiedExamples:Laser gyro mirrors with

SI Traceability of Force at the Nanonewton Level

Author(s)
David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, L Feeney, Edwin R. Williams
Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a link to the International System of Units (SI)

Low Voltage Microanalysis using Microcalorimeter EDS

Author(s)
David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, John M. Martinis, Martin Huber, Dale Newbury
We present the current performance of the prototype high-resolution microcalorimeter energy-dispersive spectrometer (υcal EDS) developed at NIST for x-ray

Future Voltage Metrology at NIST

Author(s)
Yi-hua D. Tang, June E. Sims, Michael H. Kelley
Presently NIST uses a voltage calibration path to maintain the U.S. legal volt and provide for the dissemination of an internationally consistent, accurate

Microwave Synthesizers for Atomic Frequency Standards

Author(s)
A Sen gupta, F Garcia nava, Craig Nelson, David A. Howe, F L. Walls
Following our earlier work on a new approach to synthesising the Cs hyperfine frequency of 9.192 GHz, we describe developments on its further refinements. The

Measurements of Static Noise in Display Images

Author(s)
John W. Roberts, Edward F. Kelley
The appearance of noise on a display is an important usability issue. Sources of noise include electrical interference, display driver artifacts, resampling
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