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Conferences

New Generation of the NIST Atomic Spectroscopic Databases

January 1, 2001

Author(s)

Yuri Ralchenko, Jeffrey R. Fuhr, F -. Jou, Alexander Kramida, William C. Martin, Larissa Podobedova, Joseph Reader, Edward B. Saloman, Jean E. Sansonetti, Wolfgang L. Wiese

Trapping Atoms with Evanescent Light Fields from Integrated Waveguides, ed. by Y.B. Band

January 1, 2001

Author(s)

J P. Burke, Jr, S T. Chu, Garnett W. Bryant, Carl J. Williams, Paul S. Julienne

Absolute EUV Metrology,

January 1, 2001

Author(s)

Charles S. Tarrio, Robert E. Vest, S Grantham

Improvements to the NIST/DARPA EUV Reflectometry Facility

January 1, 2001

Author(s)

Charles S. Tarrio, Thomas B. Lucatorto, S Grantham, M B. Squires, Uwe Arp, Lu Deng

Bayesian Approach to Combining Results From Multiple Methods

January 1, 2001

Author(s)

Hung-Kung Liu, Nien F. Zhang

Many solutions to the problem of estimating the consensus mean from the results of multiple methods or laboratories have been proposed. In a Bayesian analysis...

Interference in the 2.4 GHz ISM Band: Impact on the Bluetooth Access control Performance

January 1, 2001

Author(s)

Nada T. Golmie, F Mouveaux

The emergence of Bluetooth devices operating in the same 2.4 GHz ISM frequency band as existing Wireless Local Area Network devices implementing the IEEE 802.11...

Digital Rights Management: How Much Can Cryptography Help?

January 1, 2001

Author(s)

William E. Burr

Cryptography offers powerful techniques for data protection in classical communications applications. Claims are often made that some new technology will enable...

Odyssey Text Independent Evaluation Data

January 1, 2001

Author(s)

Mark A. Przybocki, Alvin F. Martin

We discuss the text-independent data supplied for the 2001: A Speaker Odyssey evaluation track. We cover the data creation and selection process, and we present...

Cu Electrodeposition for On-Chip Interconnections

January 1, 2001

Author(s)

Gery R. Stafford, Thomas P. Moffat, V D. Jovic, David R. Kelley, John E. Bonevich, Daniel Josell, Mark D. Vaudin, N G. Armstrong, W H. Huber, A Stanishevsky

The electrochemical behavior of copper in copper sulfate - sulfuric acid, containing various combinations of NaCl, sodium 3 mercapto-1 propanesulfonate (MPSA)...

Partial-Density of Occupied Valence States by X-Ray Standing Waves and High-Resolution Photoelectron Spectroscopy

January 1, 2001

Author(s)

Joseph C. Woicik, E J. Nelson, T Kendelewicz, P Pianetta

We decribe an experimental method by which site-specific valence-electronic structure may be obtained. It utilizes the spatial dependence of the electric-field...

Formation of Macropores in Calcium Phosphate Cements Through the Use of Mannitol Crystals

January 1, 2001

Author(s)

Milenko Markovic, Shozo Takagi, Laurence C. Chow

Mannitol crystals with sizes ranging from {nearly equal to} 100 m to {nearly equal to} 400 m were mixed with calcium phosphate cement (CPC) powders that...

Domain Stability in PZT Thin Films

January 1, 2001

Author(s)

Grady S. White, J Blendell, Lin-Sien H. Lum

M measurements were made on textured PZT thin films excited by a 1 V rms in the presence of various DC biasing voltages. Apparent domain pinning sites were...

Simulation of Filled Polymer Melts on Multiple Length Scales

January 1, 2001

Author(s)

Francis W. Starr, S C. Glotzer

Dielectric Characterization of Embedded Decoupling Capacitance Films at Microwave Frequencies

January 1, 2001

Author(s)

Jan Obrzut

The dielectric permittivity and impedance characteristics were evaluated for high-dielectric constant polymer composite films, that are being developed by the...

Model Based Predictions of Permeability in Preform Materials

January 1, 2001

Author(s)

Frederick R. Phelan Jr.

Confinement Induced Deviation in Ultra-thin Photoresist Films

January 1, 2001

Author(s)

Christopher L. Soles, Eric K. Lin, Wen-Li Wu, Q Lin, M Angelopoulos

Neutron Reflectivity Measurements for the Interfacial Characterization of Polymer Thin Film Photoresists

January 1, 2001

Author(s)

Eric K. Lin, Christopher L. Soles, Wen-Li Wu, Sushil K. Satija, Q Lin, M Angelopoulos

High Sensitivity Technique for Measurement of Thin Film Out-of-Plane Expansion. II. Conducting and Semiconducting Samples

January 1, 2001

Author(s)

Chad R. Snyder

This paper describes the construction, calibration, and use of a precision capacitance-based metrology for the measurement of the thermal and hygrothermal...

A Numerical Method for Color Uncertainty

January 1, 2001

Author(s)

Yoshihiro Ohno

A method for calculating uncertainties of color quantities has been developed using a numerical approach based on the ISO Guide to the Expression of Uncertainty...

Trapping Atoms With Evanescent Light Fields From Integrated Optical Waveguides

January 1, 2001

Author(s)

J P. Burke, S T. Chu, Garnett W. Bryant, Carl J. Williams, P S. Julience

We theoretically investigate three approaches to trapping atoms above linear integrated optical waveguides. A two-color scheme balances the decaying evanescent...

Integrating Sphere Simulation on Spatial Nonuniformity Errors in Luminous Flux Measurement

January 1, 2001

Author(s)

Yoshihiro Ohno, R O. Daubach

An integrating sphere simulation program, previously developed for the realization of the luminous flux unit at NIST, has been utilized to analyze spatial...

Aspects of Practical Radiometry: Terminology, Uncertainty, and Physical Optics

January 1, 2001

Author(s)

Eric L. Shirley, Raju V. Datla

We discuss efforts that have been made to help establish-in practice-a greater uniformity of nomenclature used for various terms in radiometry as well as...

A Pre-Processor for the Generation of Chemical Kinetics Data for Simulations

January 1, 2001

Author(s)

Wing Tsang

This paper describes a program designed to derive from fundamental molecular and transition state properties rate constants that are used for the simulation of...

Heat Transfer in Supercritical Carbon Dioxide With Convective Boundary Conditions

January 1, 2001

Author(s)

Douglas A. Olson

We report measurements of heat transfer coefficients of flowing supercritical carbon dioxide (7.38 MPa critical pressure, 31.1 degrees C critical temperature)...

Developments at NIST in High-Precision Length Metrology for Microelectronics

January 1, 2001

Author(s)

Dennis A. Swyt

This paper describes current work at NIST in high-precision length metrology aimed at development of such low-uncertainty reference measurements for...

SEM Sentinel - SEM Performance Measurement System

January 1, 2001

Author(s)

Bradley N. Damazo, Andras Vladar, Alice V. Ling, M A. Donmez, Michael T. Postek, Crossley E. Jayewardene

This paper describes the design and implementation of a system for monitoring the performance of a critical dimension measurement scanning electron microscope...

Kinematic Modeling and Analysis of a Planar Micro-Positioner

January 1, 2001

Author(s)

Nicholas G. Dagalakis, John A. Kramar, E Amatucci, Robert Bunch

The static and dynamic performance of a control system depends on the accuracy of the mathematical model of the plant that is being controlled. In this work...

Establishment of Measurement Traceability for NIST Standard Bullets and Casings

January 1, 2001

Author(s)

Jun-Feng Song, Theodore V. Vorburger, M Ols

The National Integrated Ballistics Information Network (NIBIN) is currently under development by the Bureau of Alcohol, Tobacco and Firearms (ATF) and the...

Overlay Metrology: Recent Advances and Future Solutions

January 1, 2001

Author(s)

Richard M. Silver, Jay S. Jun, S Fox, Edward A. Kornegay

As devices shrink and clock speeds continue to increase, process control and measurement of I critical dimension linewidths and the essential overlay of...

Neolithography Consortium: A Progress Report

January 1, 2001

Author(s)

James E. Potzick

The role of process simulation is becoming an increasingly important part of microlithography process control and photomask metrology as wafer feature sizes...

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