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Conferences

Microwave Synthesizers for Atomic Frequency Standards

Author(s)
A Sen gupta, F Garcia nava, Craig Nelson, David A. Howe, F L. Walls
Following our earlier work on a new approach to synthesising the Cs hyperfine frequency of 9.192 GHz, we describe developments on its further refinements. The

SI Traceability of Force at the Nanonewton Level

Author(s)
David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, L Feeney, Edwin R. Williams
Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a link to the International System of Units (SI)

Detection of Pinholes in Ultrathin Films by Magnetic Coupling

Author(s)
William F. Egelhoff Jr., L Gan, P J. Chen, Cedric J. Powell, Robert McMichael, R A. Fry
When two magnetic films are separated by a nonmagnetic film, pinholes in the nonmagnetic film can allow direct contact and, thereby, magnetic coupling between

Low Voltage Microanalysis using Microcalorimeter EDS

Author(s)
David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, John M. Martinis, Martin Huber, Dale Newbury
We present the current performance of the prototype high-resolution microcalorimeter energy-dispersive spectrometer (υcal EDS) developed at NIST for x-ray

Tensile Creep in the Next Generation Silicon Nitride

Author(s)
F Lofaj, Sheldon M. Wiederhorn, Gabrielle G. Long, P R. Jemian
The tensile creep behavior of a Lu-containing silicon nitride (SN 281) was characterized in the temperature range of 1350oC to 1550oC for test periods up to

Future Voltage Metrology at NIST

Author(s)
Yi-hua D. Tang, June E. Sims, Michael H. Kelley
Presently NIST uses a voltage calibration path to maintain the U.S. legal volt and provide for the dissemination of an internationally consistent, accurate
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